All Stories

  1. A ternary gate-connected threshold switching thin-film transistor
  2. Comprehensive interpretations of thermodynamic and kinetic effects on the phase fractions in Hf1-xZrxO2 by first principle calculations
  3. Improved ferroelectricity in Hf0.5Zr0.5O2 by inserting an upper HfOxNy interfacial layer
  4. Study of ferroelectric characteristics of Hf0.5Zr0.5O2 thin films grown on sputtered or atomic-layer-deposited TiN bottom electrodes
  5. Investigation of the electronic structure of amorphous SnO film using x-ray absorption spectroscopy
  6. A comprehensive study on the mechanism of ferroelectric phase formation in hafnia-zirconia nanolaminates and superlattices
  7. Temperature controlled Ru and RuO2 growth via O* radical-enhanced atomic layer deposition with Ru(EtCp)2
  8. Memristor crossbar array for binarized neural networks
  9. Mitigating wakeup effect and improving endurance of ferroelectric HfO2-ZrO2 thin films by careful La-doping
  10. A study on the wake-up effect of ferroelectric Hf0.5Zr0.5O2films by pulse-switching measurement
  11. Bipolar resistive switching behavior of an amorphous Ge2Sb2Te5thin films with a Te layer
  12. Electronic resistance switching in the Al/TiOx/Al structure for forming-free and area-scalable memory
  13. Study on the internal field and conduction mechanism of atomic layer deposited ferroelectric Hf0.5Zr0.5O2 thin films
  14. Evolution of the shape of the conducting channel in complementary resistive switching transition metal oxides
  15. Effects of O3 and H2O as oxygen sources on the atomic layer deposition of HfO2 gate dielectrics at different deposition temperatures
  16. Impedance spectroscopic analysis on effects of partial oxidation of TiN bottom electrode and microstructure of amorphous and crystalline HfO2 thin films on their bipolar resistive switching
  17. Chemistry of active oxygen in RuOx and its influence on the atomic layer deposition of TiO2 films
  18. Study on the defects in metal–organic chemical vapor deposited zinc tin oxide thin films using negative bias illumination stability analysis