All Stories

  1. Dark-field imaging based on post-processed electron backscatter diffraction patterns of bulk crystalline materials in a scanning electron microscope

    Article • Ultramicroscopy, January 2015, Elsevier

    Mr Nicolas Brodusch

  2. Electron backscatter diffraction applied to lithium sheets prepared by broad ion beam milling

    Article • Microscopy Research and Technique, October 2014, Wiley

    Mr Nicolas Brodusch

  3. Coating induced residual stress in nonoriented electrical steel laminations

    Article • Journal of Materials Research, August 2014, Springer Science + Business Media

    Mr Nicolas Brodusch

  4. Electron Channeling Contrast Observations in Deformed Magnesium Alloys

    Article • Microscopy and Microanalysis, August 2014, Oxford University Press (OUP)

    Mr Nicolas Brodusch

  5. Ionic Liquid Used for Charge Compensation for High-Resolution Imaging and Analysis in the FE-SEM

    Article • Microscopy and Microanalysis, August 2014, Oxford University Press (OUP)

    Mr Nicolas Brodusch

  6. Monte Carlo Simulation and Experimental High-Angle Annular Dark Field Tomography

    Article • Microscopy and Microanalysis, August 2014, Oxford University Press (OUP)

    Mr Nicolas Brodusch

  7. Effect of a Coating Induced Residual Stress on Magnetic Domain Structure in Non-Oriented Electrical Steels

    Article • Microscopy and Microanalysis, August 2014, Oxford University Press (OUP)

    Mr Nicolas Brodusch

  8. Magnetic Domain Structure and Crystal Orientation Revealed by a Forescatter Detector and Electron Backscatter Diffraction.

    Article • Microscopy and Microanalysis, August 2014, Oxford University Press (OUP)

    Mr Nicolas Brodusch

  9. Transmission Electron Forward Scattered Diffraction and Low Voltage SEM/STEM Characterization of Binder-Free TiO2 Electrodes

    Article • Microscopy and Microanalysis, August 2014, Oxford University Press (OUP)

    Mr Nicolas Brodusch

  10. Sliding-induced Microstructure of Cold-Sprayed Copper Coating Observed by Electron Channeling Contrast Imaging

    Article • Microscopy and Microanalysis, August 2014, Oxford University Press (OUP)

    Mr Nicolas Brodusch

  11. High Resolution Imaging in the Field Emission Scanning Electron Microscope at Low Accelerating Voltage and with Energy-Filtration of the Electron Signals

    Article • Microscopy and Microanalysis, August 2014, Oxford University Press (OUP)

    Mr Nicolas Brodusch

  12. X-ray Quantitative Microanalysis Maps across Interfaces of a Cu-Al Roll Bonded Laminate with an Annular Silicon Drift Detector

    Article • Microscopy and Microanalysis, August 2014, Oxford University Press (OUP)

    Mr Nicolas Brodusch

  13. X-Ray Microanalysis with High Spatial Resolution and High Counts Rate with a State of the Art Field Emission Scanning Electron Microscope

    Article • Microscopy and Microanalysis, August 2014, Oxford University Press (OUP)

    Mr Nicolas Brodusch

  14. Magnetic domain structure and crystallographic orientation of electrical steels revealed by a forescatter detector and electron backscatter diffraction

    Article • Ultramicroscopy, July 2014, Elsevier

    Mr Nicolas Brodusch

  15. Microstructure Refinement of Cold-Sprayed Copper Investigated By Electron Channeling Contrast Imaging

    Article • Microscopy and Microanalysis, June 2014, Oxford University Press (OUP)

    Mr Nicolas Brodusch

  16. High‐resolution imaging and X‐ray microanalysis in the FE‐SEM

    Article • Surface and Interface Analysis, June 2014, Wiley

    Mr Nicolas Brodusch

  17. Grain boundary diffusion of Al in Mg

    Article • Scripta Materialia, June 2014, Elsevier

    Mr Nicolas Brodusch

  18. Initiation and accommodation of primary twins in high-purity titanium

    Article • Acta Materialia, June 2014, Elsevier

    Mr Nicolas Brodusch

  19. Ionic liquid-based observation technique for nonconductive materials in the scanning electron microscope: Application to the characterization of a rare earth ore

    Article • Microscopy Research and Technique, January 2014, Wiley

    Mr Nicolas Brodusch

  20. Variations in nanomechanical properties of back-end Zr–2.5Nb pressure tube material

    Article • Journal of Nuclear Materials, November 2013, Elsevier

    Mr Nicolas Brodusch

  21. Dark-Field Imaging of Thin Specimens with a Forescatter Electron Detector at Low Accelerating Voltage

    Article • Microscopy and Microanalysis, August 2013, Oxford University Press (OUP)

    Mr Nicolas Brodusch

  22. Acquisition parameters optimization of a transmission electron forward scatter diffraction system in a cold‐field emission scanning electron microscope for nanomaterials characterization

    Article • Scanning, February 2013, Wiley

    Mr Nicolas Brodusch

  23. Measurement of Palladium Crust Thickness on Catalysts by Optical Microscopy and Image Analysis

    Article • Microscopy and Microanalysis, February 2013, Oxford University Press (OUP)

    Dr Loïc Sorbier, Mr Nicolas Brodusch

  24. Contribution of a New Generation Field-Emission Scanning Electron Microscope in the Understanding of a 2099 Al-Li Alloy

    Article • Microscopy and Microanalysis, October 2012, Oxford University Press (OUP)

    Mr Nicolas Brodusch

  25. Improvement in the Characterization of the 2099 Al‐Li Alloy by Fe‐SEM

    Article • June 2012, Wiley

    Mr Nicolas Brodusch

  26. Determination of Diffusion Coefficients with Quantitative X-Ray Microanalysis at High - Spatial Resolution

    Article • Defect and Diffusion Forum, April 2012, Trans Tech Publications

    Mr Nicolas Brodusch

  27. New benchmark for basic and neutral nitrogen compounds speciation in middle distillates using comprehensive two-dimensional gas chromatography

    Article • Journal of Chromatography A, April 2007, Elsevier

    Mr Nicolas Brodusch