All Stories

  1. Near-field microwave microscopy for the characterization of dielectric materials

    Article • International Journal of Microwave and Wireless Technologies, September 2014, Cambridge University Press

    Dr jamal Rammal

  2. Non-destructive microwave characterization and imaging of dielectric materials using a near field technique

    Article • September 2013, Institute of Electrical & Electronics Engineers (IEEE)

    Dr jamal Rammal

  3. Multimaterial inkjet technology for the fabrication of multilayer components

    Article • September 2013, Institute of Electrical & Electronics Engineers (IEEE)

    Dr jamal Rammal