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  1. Non-ohmic hopping conduction of a diode base extracted from the diode current-voltage characteristics

    Article • The European Physical Journal Applied Physics, January 2014, EDP Sciences

    Dr Vitalii L Borblik

  2. Determination of ‘bisotropic’ stresses in layered semiconductor structures from Raman light scattering data

    Article • Journal of Physics Condensed Matter, October 2007, Institute of Physics Publishing

    Dr Vitalii L Borblik