All Stories

  1. Bayes-TDG: Effective Test Data Generation Using Bayesian Belief Network:Towards Failure-Detection Effectiveness and Maximum Coverage

    Article • IET Software, February 2018, the Institution of Engineering and Technology (the IET)

    saeed parsa, Farid Feyzi

  2. FPA-FL: Incorporating static fault-proneness analysis into statistical fault localization

    Article • Journal of Systems and Software, February 2018, Elsevier

    Farid Feyzi

  3. A program slicing-based method for effective detection of coincidentally correct test cases

    Article • Computing, January 2018, Springer Science + Business Media

    Farid Feyzi

  4. Enhancing path-oriented test data generation using adaptive random testing techniques

    Article • November 2015, Institute of Electrical & Electronics Engineers (IEEE)

    Farid Feyzi