All Stories

  1. Comparative analysis of a deep learning approach with various classification techniques for credit score computation

    Article • Recent Advances in Computer Science and Communications, July 2020, Bentham Science Publishers

    Mr Arvind Pandey, Krishna Kumar Mohbey

  2. Comparison of additive shared frailty models under Lindley baseline distribution

    Article • Communications in Statistics - Simulation and Computation, September 2019, Taylor & Francis

    Mr Arvind Pandey, Ralte Lalpawimawha

  3. Correlated inverse Gaussian frailty models for bivariate survival data

    Article • Communication in Statistics- Theory and Methods, December 2018, Taylor & Francis

    Mr Arvind Pandey

  4. On optimality of imputation methods for estimation of population mean using higher order moment of an auxiliary variable

    Article • Communications in Statistics - Simulation and Computation, December 2018, Taylor & Francis

    Mr Arvind Pandey

  5. Shared frailty models with baseline generalized Pareto distribution

    Article • Communication in Statistics- Theory and Methods, November 2018, Taylor & Francis

    Mr Arvind Pandey, Ralte Lalpawimawha

  6. Shared frailty model based on reversed hazard rate for left censored data

    Article • Communications in Statistics - Simulation and Computation, October 2014, Taylor & Francis

    Mr Arvind Pandey

  7. Gamma frailty models for bivariate survival data

    Article • Journal of Statistical Computation and Simulation, September 2014, Taylor & Francis

    Mr Arvind Pandey

  8. Gamma shared frailty model based on reversed hazard rate for bivariate survival data

    Article • Statistics & Probability Letters, May 2014, Elsevier

    Mr Arvind Pandey

  9. Gamma shared frailty model based on reversed hazard rate

    Article • Communication in Statistics- Theory and Methods, January 2014, Taylor & Francis

    Mr Arvind Pandey

  10. Strong law for number of edges on surface of a unit sphere

    Article • December 2009, Institute of Electrical & Electronics Engineers (IEEE)

    Mr Arvind Pandey