All Stories

  1. Hopping conduction and LF noise in structures with Ge nanoclusters grown on oxidized Si(001)
  2. Physical Insights on Charge Transport Mechanism and the LF Noise Behavior in Oxidized Si Structures with Ge Nanoclusters
  3. Hopping Conduction in Structures with Ge Nanoclusters Grown on Oxidized Si (001)
  4. Metal-graphene contact capacitance
  5. Transport and Photoelectric Effects in Structures with Ge and SiGe Nanoclusters Grown on Oxidized Si (001)
  6. Electrical Properties and Charge Transport in the Pd/Al2O3/InGaAs MOS Structure
  7. Surface reconstruction and optical absorption changes for Ge nanoclusters grown on chemically oxidized Si(1 0 0) surfaces
  8. Current transport mechanisms in metal – high-k dielectric – silicon structures
  9. Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements
  10. Effect of vacuum annealing on charge transport and trapping in a-Si1−xCx:H/c-Si heterostructures
  11. Carrier transfer effect on transport in p-i-n structures with Ge quantum dots
  12. Interface and Bulk Properties of High-K Gadolinium and Neodymium Oxides on Silicon
  13. Transport and interface states in high-κ LaSiOx dielectric
  14. Electrical Properties of High-K LaLuO3 Gate Oxide for SOI MOSFETs
  15. Effect of Ge Nanoislands on Lateral Photoconductivity of Ge-SiOX-Si Structures
  16. Influence of oxidation temperature on photoluminescence and electrical properties of amorphous thin film SiC:H:O+Tb
  17. Electrical Properties of LaLuO
  18. Interface and Bulk Properties of MBE-Grown Rare-Earth Metal Oxides on Silicon
  19. Charge trapping in ultrathin Gd2O3 high-k dielectric
  20. Charge states and quantitative infrared spectroscopy of electrically active oxygen centers in gallium arsenide
  21. Charge trapping and interface states in hydrogen annealed HfO2–Si structures
  22. Low-temperature conductance measurements of surface states in HfO2–Si structures with different gate materials
  23. Splitting of the local mode frequency of substitutional nitrogen in (Ga, In)(As, N) alloys due to symmetry lowering
  24. Correlation of band formation and local vibrational mode structure in Ga0.95Al0.05As1–xNx with 0 ≤x ≤ 0.03
  25. Analysis of electrically active N–O complexes in nitrogen-doped CZ silicon crystals by FTIR spectroscopy
  26. Far-infrared absorption due to electronic transitions of N–O complexes in Czochralski-grown silicon crystals: Influence of nitrogen and oxygen concentration
  27. Local mode frequencies of the N As − In Ga nearest-neighbor pair in ( Ga , In ) ( As , N ) alloys
  28. Spectroscopic evidence for a N-Ga vacancy defect in GaAs
  29. GaAsN formation by implantation of nitrogen into GaAs studied by infrared spectroscopy
  30. Far-infrared absorption due to shallow acceptors in semi-insulating GaAs in dependence on EL2 bleaching
  31. Quantitative spectroscopy of substitutional nitrogen in GaAs 1  x N x epitaxial layers by local vibrational mode absorption
  32. Method to Determine Carbon in Silicon by Infrared Absorption Spectroscopy
  33. Far-infrared spectroscopy of shallow acceptors in semi-insulating GaAs: evidence for defect interactions with EL2
  34. Cryogenic Investigations of SIMOX Buried Oxide Parameters
  35. Thermally activated processes in the buried oxide of SIMOX SOI structures and devices
  36. Effect of oxide–semiconductor interface traps on low-temperature operation of MOSFETs
  37. Effect of traps in the transition Si/SiO2 layer on input characteristics of SOI transistors
  38. Effect of Shallow Oxide Traps on the Low-Temperature Operation of SOI Transistors
  39. Electrical characterization of the amorphous SiC-pSi structure
  40. Thermally stimulated characterization of shallow traps in the SiC/Si heterojunction
  41. The electrical assessment of Si1-xGex/Si heterostructures
  42. Electric field effects at the surface of high-temperature superconductors
  43. Flux pinning under the strong electrostatic field in the BiPbSrCaCuO film
  44. Thermally Activated Dissipation and Upper Critical Magnetic Field under the Strong Electrostatic Field in the BiPbSrCaCuO Thin Film
  45. Investigation of traps in the nSiCpSi interface at cryogenic temperatures
  46. Electric field effect on excess conductivity in high-Tc superconductors
  47. Critical currents in oxygen-implanted YBa2Cu3O7−σ thin films under magnetic and electrostatic fields
  48. Excess conductivity and thermally activated dissipation studies under strong electrostatic field in YBa2Cu3O7−δ thin films
  49. Effect of Strong Electrostatic Fields on the Properties of Y1−xPrxBa2Cu3O7-Δ Ceramics
  50. Thermally stimulated field emission of charge from traps in the transition layer of SiSiO2 structures
  51. Current stochasticity of field emission of charge from traps in the transition layer of implanted MIS structures