All Stories

  1. Impact of formation process on the radiation properties of single-photon sources generated on SiC crystal surfaces
  2. Formation of nitrogen-vacancy centers in 4H-SiC and their near infrared photoluminescence properties
  3. Creation of Color Centers in SiC PN Diodes Using Proton Beam Writing
  4. Macroscopic simulations of the SiC thermal oxidation process based on the Si and C emission model
  5. First-principles study of oxygen-related defects on 4H-SiC surface: The effects of surface amorphous structure
  6. Oxygen-incorporated single-photon sources observed at the surface of silicon carbide crystals
  7. Various Single Photon Sources Observed in SiC Pin Diodes
  8. Room Temperature Electrical Control of Single Photon Sources at 4H-SiC Surface
  9. Generation of stacking faults in 4H-SiC epilayer induced by oxidation
  10. Silicon vacancy creation in SiC by proton beam writing
  11. Three-Dimensional Proton Beam Writing of Optically Active Coherent Vacancy Spins in Silicon Carbide
  12. Optimum structures for gamma-ray radiation resistant SiC-MOSFETs
  13. Impacts of gate bias and its variation on gamma-ray irradiation resistance of SiC MOSFETs
  14. Effect of gamma-ray irradiation on the device process-induced defects in 4H-SiC epilayers
  15. Improvement of radiation response of SiC MOSFETs under high temperature and humidity conditions
  16. Unified theory of silicon carbide oxidation based on the Si and C emission model
  17. WBD power device engineer
  18. Gamma-Ray Irradiation Response of the Motor-Driver Circuit with SiC MOSFETs
  19. Photoluminescence study of oxidation-induced faults in 4H-SiC epilayers
  20. Radiation response of silicon carbide metal–oxide–semiconductor transistors in high dose region
  21. Molecular beam epitaxial growth of intermediate-band materials based on GaAs:N δ-doped superlattices
  22. Control of intermediate-band configuration in GaAs:N δ-doped superlattice
  23. Photoluminescence Study of Oxidation-Induced Stacking Faults in 4H-SiC Epilayers
  24. Surface Orientation Dependence of SiC Oxidation Process Studied by In Situ Spectroscopic Ellipsometry
  25. Recovery of the Electrical Characteristics of SiC MOSFETs Irradiated with Gamma-Rays by Thermal Treatments
  26. Si and C emission into the oxide layer during the oxidation of silicon carbide and its influence on the oxidation rate
  27. Growth temperature dependence of the surface segregation of Er atoms in GaAs during molecular beam epitaxy
  28. Differences in SiC thermal oxidation process between crystalline surface orientations observed by in-situ spectroscopic ellipsometry
  29. Enhanced optical absorption due to E + -related band transition in GaAs:N δ-doped superlattices
  30. Photoreflectance study of the temperature dependence of excitonic transitions in dilute GaAsN alloys
  31. Si Emission into the Oxide Layer during Oxidation of Silicon Carbide
  32. Analysis of Electronic Structures of Nitrogen δ-Doped GaAs Superlattices for High Efficiency Intermediate Band Solar Cells
  33. Conversion Efficiency of Intermediate Band Solar Cells with GaAs:N δ-Doped Superlattices
  34. Stacked structure of self-organized cubic InN nano-dots grown by molecular beam epitaxy
  35. Molecular beam epitaxy of ErGaAs alloys on GaAs (001) substrates
  36. RF-MBE growth of cubic InN nano-scale dots on cubic GaN
  37. Optical absorption by E+ miniband of GaAs:N δ-doped superlattices
  38. Biexciton emission from single isoelectronic traps formed by nitrogen-nitrogen pairs in GaAs
  39. Model Calculations of SiC Oxide Growth Rates at Sub-Atmospheric Pressures Using the Si and C Emission Model
  40. Biexciton Luminescence from Individual Isoelectronic Traps in Nitrogen $\delta$-Doped GaAs
  41. Nondestructive and Contactless Characterization Method for Spatial Mapping of the Thickness and Electrical Properties in Homo-Epitaxially Grown SiC Epilayers Using Infrared Reflectance Spectroscopy
  42. Physics and Technology of Silicon Carbide Devices
  43. Thermal Oxidation Mechanism of Silicon Carbide
  44. Oxygen partial pressure dependence of the SiC oxidation process studied by in-situ spectroscopic ellipsometry
  45. Analysis of the energy structure of nitrogen δ-doped GaAs superlattices for high efficiency intermediate band solar cells
  46. Micro-Photoluminescence Study on the Influence of Oxidation on Stacking Faults in 4H-SiC Epilayers
  47. RF-MBE growth of semipolar InN(10-13) and InGaN(10-13) on GaAs(110)
  48. Single Photon Generation from Nitrogen Atomic-Layer Doped Gallium Arsenide
  49. Quantum well double barrier resonant tunneling structures for selective contacts of hot carrier solar cells
  50. Growth Rate Enhancement of Silicon-Carbide Oxidation in Thin Oxide Regime
  51. Theoretical Studies for Si and C Emission into SiC Layer during Oxidation
  52. High Cubic-Phase Purity InN on MgO (001) Using Cubic-Phase GaN as a Buffer Layer
  53. Photoluminescence from single isoelectronic traps in nitrogen delta-doped GaAs grown on GaAs(111)A
  54. RF-MBE growth of InN on 4H-SiC (0001) with off-angles
  55. In Situ Spectroscopic Ellipsometry Study of SiC Oxidation at Low Oxygen-Partial-Pressures
  56. Model Calculations of SiC Oxide Growth Rate at Various Oxidation Temperatures Based on the Silicon and Carbon Emission Model
  57. Optical and electrical characterizations of 4H-SiC–oxide interfaces by spectroscopic ellipsometry and capacitance–voltage measurements
  58. Model Calculation of SiC Oxide Growth Rate Based on the Silicon and Carbon Emission Model
  59. Observation of SiC Oxidation in Ultra-Thin Oxide Regime by In Situ Spectroscopic Ellipsometry
  60. A Kinetic Model of Silicon Carbide Oxidation Based on the Interfacial Silicon and Carbon Emission Phenomenon
  61. Oxide Growth Rate Enhancement of Silicon Carbide (0001) Si-Faces in Thin Oxide Regime
  62. Improvement of the surface morphology ofa -plane InN using low-temperature InN buffer layers
  63. Photoluminescence of cubic InN films on MgO (001) substrates
  64. Photoluminescence study of hexagonal InN/InGaN quantum well structures grown on 3C-SiC (001) substrates by molecular beam epitaxy
  65. Twin photoluminescence peaks from single isoelectronic traps in nitrogen δ-doped GaAs
  66. MOS capacitors obtained by wet oxidation of n-type 4H–SiC pre-implanted with nitrogen
  67. Growth Rate Enhancement of (000\bar1)-Face Silicon–Carbide Oxidation in Thin Oxide Regime
  68. Photoluminescence study of isoelectronic traps in dilute GaAsN alloys
  69. RF-MBE growth of InN/InGaN quantum well structures on 3C–SiC substrates
  70. RF-MBE growth of a-plane InN on r-plane sapphire with a GaN underlayer
  71. Micro-Raman study on the improvement of luminescence efficiency of GaAsN alloys
  72. Micro-photoluminescence study of nitrogen delta-doped GaAs grown by metalorganic vapor phase epitaxy
  73. Simultaneous Determination of Carrier Concentration, Mobility, and Thickness of SiC Homoepilayers by Infrared Reflectance Spectroscopy
  74. Characterization of oxide films on 4H-SiC epitaxial (0001¯) faces by high-energy-resolution photoemission spectroscopy: Comparison between wet and dry oxidation
  75. Photo-induced improvement of radiative efficiency and structural changes in GaAsN alloys
  76. RF-MBE growth of cubic InN films on MgO (001) substrates
  77. Growth of high-quality hexagonal InN on 3C-SiC (001) by molecular beam epitaxy
  78. Effect of Ar post-oxidation annealing on oxide–4H-SiC interfaces studied by capacitance to voltage measurements and photoemission spectroscopy
  79. Epitaxial growth of hexagonal and cubic InN films
  80. Characterization of Carrier Concentration and Mobility in n-type SiC Wafers Using Infrared Reflectance Spectroscopy
  81. Improvement in the luminescence efficiency of GaAsN alloys by photoexcitation
  82. Spectroscopic ellipsometry study on the dielectric functions of GaPN alloys
  83. Characterization of the Interfaces between SiC and Oxide Films by Spectroscopic Ellipsometry
  84. The Investigation of 4H-SiC/SiO2 Interfaces by Optical and Electrical Measurements
  85. X-Ray Photoelectron Spectroscopy Studies of Post-Oxidation Process Effects on Oxide/SiC Interfaces
  86. Measurements of the Depth Profile of the Refractive Indices in Oxide Films on SiC by Spectroscopic Ellipsometry
  87. Composition analysis of SiO2/SiC interfaces by electron spectroscopic measurements using slope-shaped oxide films
  88. Photoluminescence Study on Temperature Dependence of Band Gap Energy of GaAsN Alloys
  89. Spectroscopic Ellipsometry Study on the Electronic Structure near the Absorption Edge of GaAsN Alloys
  90. Characterization of Oxide Films on SiC by Spectroscopic Ellipsometry
  91. Pressure Sensitivity of a Fiber-Optic Microprobe for High-Frequency Ultrasonic Field