All Stories

  1. Detecting Adversarial Samples with Graph-Guided Testing

    Article • November 2021, Institute of Electrical & Electronics Engineers (IEEE)

    Yue Yu, Zuohui Chen

  2. You Can’t Fool All the Models: Detect Adversarial Samples via Pruning Models

    Article • IEEE Access, January 2021, Institute of Electrical & Electronics Engineers (IEEE)

    Zuohui Chen