All Stories

  1. The material dependence of temperature measurement resolution in thermal scanning electron microscopy

    Article • Applied Physics Letters, March 2013, American Institute of Physics

    Dr Xiaowei Wu

  2. A Low Electron Voltage Approach to Increase Spatial Resolution of Temperature Mapping in Thermal Scanning Electron Microscopy

    Article • MRS Proceedings, January 2013, Springer Science + Business Media

    Dr Xiaowei Wu

  3. A novel nano-scale non-contact temperature measurement technique for crystalline materials

    Article • Nanotechnology, October 2012, Institute of Physics Publishing

    Dr Xiaowei Wu