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  1. Influence of fabrication steps on optical and electrical properties of InN thin films
  2. Analysis of InAl(Ga)N/GaN wet-etching by structural, morphological and electrical methods
  3. Impact of AlN Spacer on Metal–Semiconductor–Metal Pt–InAlGaN/GaN Heterostructures for Ultraviolet Detection
  4. Structural and morphological studies on wet-etched InAlGaN barrier HEMT structures
  5. Investigation of AlInN barrier ISFET structures with GaN capping for pH detection
  6. Nanocrack-induced leakage current in AlInN/AlN/GaN
  7. Volume charge carrier number fluctuations probed by low frequency noise measurements in InN layers