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  1. Optimum life test plan for Type-I hybrid censored Weibull distributed products sold under general rebate warranty
  2. Bayesian C-optimal life testing plans under progressive type-I interval censoring scheme
  3. Bayesian accelerated life test plans for series systems with Weibull component lifetimes
  4. Bayesian optimum life testing plans under progressive Type-I interval censoring scheme
  5. Estimation of P(X
  6. Inference based on progressive Type I interval censored data from log-normal distribution
  7. BayesianD-optimal Accelerated Life Test plans for series systems with competing exponential causes of failure
  8. Bayesian accelerated life testing under competing log-location-scale family of causes of failure
  9. Maximum likelihood analysis of multi-stress accelerated life test data of series systems with competing log-normal causes of failure
  10. Bayesian Accelerated Life Testing under Competing Weibull Causes of Failure
  11. Inference for the Component and System Lifetime Distribution of ak-unit Parallel System Based on System Data
  12. Forecasting day-ahead price of electricity - a dynamic regression approach