All Stories

  1. Impact of VUV photons on SiO2 and organosilicate low-k dielectrics: General behavior, practical applications, and atomic models

    Article • Applied Physics Reviews, March 2019, American Institute of Physics

    Sean King, Afanas'ev Valeri

  2. Detection of surface electronic defect states in low and high-k dielectrics using reflection electron energy loss spectroscopy

    Article • Journal of Materials Research, October 2013, Springer Science + Business Media

    Sean King

  3. Research Updates: The three M's (materials, metrology, and modeling) together pave the path to future nanoelectronic technologies

    Article • APL Materials, October 2013, American Institute of Physics

    Sean King

  4. Detection of defect states in low-k dielectrics using reflection electron energy loss spectroscopy

    Article • Journal of Applied Physics, January 2013, American Institute of Physics

    Sean King

  5. Validation of a correction procedure for removing the optical effects from transmission spectra of thin films on substrates

    Article • Journal of Applied Physics, November 2012, American Institute of Physics

    Sean King

  6. Valence band offset at the amorphous hydrogenated boron nitride-silicon (100) interface

    Article • Applied Physics Letters, July 2012, American Institute of Physics

    Sean King

  7. A method to extract absorption coefficient of thin films from transmission spectra of the films on thick substrates

    Article • Journal of Applied Physics, April 2012, American Institute of Physics

    Sean King