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  1. Raman Spectroscopy Investigation of a Manganese Oxide Layer Caused by Water Corrosion on an IrMn Thin Film
  2. Effects of Buffer Layer Growth Temperature on Micro-Structures in the Cubic GaN Films Grown on GaAs (001) Substrates by MOVPE
  3. TEM Analysis of Planar Defects in InGaAsN and GaAs Grown on Ge (001) by MOVPE