All Stories

  1. Metrology for Additive Manufacturing

    Article • Measurement and Control, May 2016, SAGE Publications

    Professor Richard Leach

  2. Surface texture measurement for additive manufacturing

    Article • Surface Topography Metrology and Properties, May 2015, Institute of Physics Publishing

    Professor Richard Leach

  3. Review of the mathematical foundations of data fusion techniques in surface metrology

    Article • Surface Topography Metrology and Properties, April 2015, Institute of Physics Publishing

    Professor Richard Leach

  4. Review of feature boundary identification techniques for the characterization of tessellated surfaces

    Article • Surface Topography Metrology and Properties, February 2015, Institute of Physics Publishing

    Professor Richard Leach

  5. Open questions in surface topography measurement: a roadmap

    Article • Surface Topography Metrology and Properties, January 2015, Institute of Physics Publishing

    Professor Richard Leach

  6. Development of low-cost material measures for calibration of the metrological characteristics of areal surface texture instruments

    Article • CIRP Annals, January 2015, Elsevier

    Professor Richard Leach

  7. Long working distance microscope with a low obscuration aspherical Schwarzschild objective

    Article • Optics Letters, November 2014, Optical Society of America (OSA)

    Professor Richard Leach

  8. Comparison of segmentation techniques to determine the geometric parameters of structured surfaces

    Article • Surface Topography Metrology and Properties, November 2014, Institute of Physics Publishing

    Professor Richard Leach

  9. New method development in prehistoric stone tool research: Evaluating use duration and data analysis protocols

    Article • Micron, October 2014, Elsevier

    Professor Richard Leach

  10. Interpreting the probe-surface interaction of surface measuring instruments, or what is a surface?

    Article • Surface Topography Metrology and Properties, July 2014, Institute of Physics Publishing

    Professor Richard Leach

  11. On the characterisation of periodic patterns in tessellated surfaces

    Article • Surface Topography Metrology and Properties, April 2014, Institute of Physics Publishing

    Professor Richard Leach

  12. On the characterisation of periodic patterns in tessellated surfaces

    Article • Surface Topography Metrology and Properties, April 2014, Institute of Physics Publishing

    Professor Richard Leach

  13. Development of material measures for performance verifying surface topography measuring instruments

    Article • Surface Topography Metrology and Properties, March 2014, Institute of Physics Publishing

    Professor Richard Leach

  14. Coherence scanning interferometry: measurement and correction of three-dimensional transfer and point-spread characteristics

    Article • Applied Optics, March 2014, Optical Society of America (OSA)

    Professor Richard Leach

  15. Abbe Error/Offset

    Article • January 2014, Springer Science + Business Media

    Professor Richard Leach

  16. Surface Texture

    Article • January 2014, Springer Science + Business Media

    Professor Richard Leach

  17. Displacement Measurement

    Article • January 2014, Elsevier

    Professor Richard Leach

  18. Precision Measurement Instrumentation – Some Design Principles

    Article • January 2014, Elsevier

    Professor Richard Leach

  19. Some Basics of Measurement

    Article • January 2014, Elsevier

    Professor Richard Leach

  20. Surface Topography Measurement Instrumentation

    Article • January 2014, Elsevier

    Professor Richard Leach

  21. Surface Topography Characterisation

    Article • January 2014, Elsevier

    Professor Richard Leach

  22. Coordinate Metrology

    Article • January 2014, Elsevier

    Professor Richard Leach

  23. Mass and Force Measurement

    Article • January 2014, Elsevier

    Professor Richard Leach

  24. Introduction to Metrology for Advanced Manufacturing and Micro- and Nanotechnology

    Article • January 2014, Elsevier

    Professor Richard Leach

  25. Scanning Probe and Particle Beam Microscopy

    Article • January 2014, Elsevier

    Professor Richard Leach

  26. ISO Definition of Resolution for Surface Topography Measuring Instruments

    Article • January 2014, Springer Science + Business Media

    Professor Richard Leach

  27. Testing the Mechanical Characteristics and Contacting Behaviour of Novel Manufactured and Assembled Sphere-Tipped Styli for Micro-CMM Probes

    Article • January 2014, Springer Science + Business Media

    Professor Richard Leach

  28. Practical estimation of measurement noise and flatness deviation on focus variation microscopes

    Article • CIRP Annals, January 2014, Elsevier

    Professor Richard Leach

  29. Applications of super-resolution imaging in the field of surface topography measurement

    Article • Surface Topography Metrology and Properties, December 2013, Institute of Physics Publishing

    Professor Richard Leach

  30. Welcome to Surface Topography: Metrology and Properties

    Article • Surface Topography Metrology and Properties, October 2013, Institute of Physics Publishing

    Professor Richard Leach

  31. Morphologic segmentation algorithms for extracting individual surface features from areal surface topography maps

    Article • Surface Topography Metrology and Properties, October 2013, Institute of Physics Publishing

    Professor Richard Leach

  32. Calibration of the scales of areal surface topography measuring instruments: part 3. Resolution

    Article • Measurement Science and Technology, September 2013, Institute of Physics Publishing

    Professor Richard Leach

  33. Coherence scanning interferometry: linear theory of surface measurement

    Article • Applied Optics, May 2013, Optical Society of America (OSA)

    Professor Richard Leach

  34. Development of a three-dimensional vibrating tactile probe for miniature CMMs

    Article • Precision Engineering, April 2013, Elsevier

    Professor Richard Leach

  35. Determination of the transfer function for optical surface topography measuring instruments—a review

    Article • Measurement Science and Technology, March 2013, Institute of Physics Publishing

    Professor Richard Leach

  36. Metrology Challenges for Highly Parallel Micro-Manufacture

    Article • January 2013, Research Publishing Services

    Professor Richard Leach

  37. Characterisation of Areal Surface Texture

    Article • January 2013, Springer Science + Business Media

    Professor Richard Leach

  38. Traceability and Calibration of Surface Texture Measurement Instrumentation

    Article • January 2013, Springer Science + Business Media

    Professor Richard Leach

  39. Introduction to Surface Topography

    Article • January 2013, Springer Science + Business Media

    Professor Richard Leach

  40. Characterisation of the Mechanical Bond Strength for Copper on Glass Plating Applications

    Article • January 2013, Springer Science + Business Media

    Professor Richard Leach

  41. Correction for lateral distortion in coherence scanning interferometry

    Article • CIRP Annals, January 2013, Elsevier

    Professor Richard Leach

  42. Verification of the numerical aperture of laser scanning confocal microscope objective

    Article • October 2012, SPIE

    Professor Richard Leach

  43. Advances in engineering nanometrology at the National Physical Laboratory

    Article • Measurement Science and Technology, June 2012, Institute of Physics Publishing

    Professor Richard Leach

  44. Calibration of the scales of areal surface topography measuring instruments: part 2. Amplification, linearity and squareness

    Article • Measurement Science and Technology, May 2012, Institute of Physics Publishing

    Professor Richard Leach

  45. Application of linear systems theory to characterize coherence scanning interferometry

    Article • April 2012, SPIE

    Professor Richard Leach

  46. Aperiodic interferometer for six degrees of freedom position measurement

    Article • Optics Letters, March 2012, Optical Society of America (OSA)

    Professor Richard Leach

  47. Quality control for deep x-ray lithography (LIGA): a preliminary metrology study

    Article • Microsystem Technologies, February 2012, Springer Science + Business Media

    Professor Richard Leach

  48. Calibration of the scales of areal surface topography-measuring instruments: part 1. Measurement noise and residual flatness

    Article • Measurement Science and Technology, February 2012, Institute of Physics Publishing

    Professor Richard Leach

  49. Semi-automated Assembly of a MEMS-Based Micro-scale CMM Probe and Future Optimization of the Process Chain with a View to Desktop Factory Automation

    Article • January 2012, Springer Science + Business Media

    Professor Richard Leach

  50. 13th International Conference on Metrology and Properties of Engineering Surfaces

    Article • Journal of Physics Conference Series, August 2011, Institute of Physics Publishing

    Professor Richard Leach

  51. Improving plated copper adhesion for metallisation of glass PCBs

    Article • August 2011, Institute of Electrical & Electronics Engineers (IEEE)

    Professor Richard Leach

  52. Numerical characterisation of biomedical titanium surface texture using novel feature parameters

    Article • Wear, July 2011, Elsevier

    Professor Richard Leach

  53. A virtual machine-based uncertainty evaluation for a traceable areal surface texture measuring instrument

    Article • Measurement, June 2011, Elsevier

    Professor Richard Leach

  54. Assembly of a novel MEMS-based 3D vibrating micro-scale co-ordinate measuring machine probe using desktop factory automation

    Article • May 2011, Institute of Electrical & Electronics Engineers (IEEE)

    Professor Richard Leach

  55. The European nanometrology landscape

    Article • Nanotechnology, January 2011, Institute of Physics Publishing

    Professor Richard Leach

  56. Optical Measurement of Surface Topography

    Article • January 2011, Springer Science + Business Media

    Professor Richard Leach

  57. Introduction to Surface Texture Measurement

    Article • January 2011, Springer Science + Business Media

    Professor Richard Leach

  58. Calibration of Optical Surface Topography Measuring Instruments

    Article • January 2011, Springer Science + Business Media

    Professor Richard Leach

  59. Some Common Terms and Definitions

    Article • January 2011, Springer Science + Business Media

    Professor Richard Leach

  60. Advanced optical techniques for the measurement of the internal geometry of MEMS structures

    Article • August 2010, SPIE

    Professor Richard Leach

  61. Bandwidth characteristics and comparisons of surface texture measuring instruments

    Article • Measurement Science and Technology, June 2010, Institute of Physics Publishing

    Professor Richard Leach

  62. Traceability for Areal Surface Texture Measurement

    Article • Key Engineering Materials, May 2010, Trans Tech Publications

    Professor Richard Leach

  63. Numerical modelling methodology for design of miniaturised integrated products - an application to 3D CMM micro-probe development

    Article • April 2010, Institute of Electrical & Electronics Engineers (IEEE)

    Professor Richard Leach

  64. Bandwidth characteristics and comparisons of surface texture measuring instruments

    Article • Measurement Science and Technology, January 2010, Institute of Physics Publishing

    Professor Richard Leach

  65. Surface topography measurement instrumentation

    Article • January 2010, Elsevier

    Professor Richard Leach

  66. Surface topography characterization

    Article • January 2010, Elsevier

    Professor Richard Leach

  67. Coordinate metrology

    Article • January 2010, Elsevier

    Professor Richard Leach

  68. Mass and force measurement

    Article • January 2010, Elsevier

    Professor Richard Leach

  69. Some basics of measurement

    Article • January 2010, Elsevier

    Professor Richard Leach

  70. Displacement measurement

    Article • January 2010, Elsevier

    Professor Richard Leach

  71. Introduction to metrology for micro- and nanotechnology

    Article • January 2010, Elsevier

    Professor Richard Leach

  72. Precision measurement instrumentation – some design principles

    Article • January 2010, Elsevier

    Professor Richard Leach

  73. Utilisation of FIB/SEM Technology in the Assembly of an Innovative Micro-CMM Probe

    Article • January 2010, Springer Science + Business Media

    Professor Richard Leach

  74. A vibrating micro-scale CMM probe for measuring high aspect ratio structures

    Article • Microsystem Technologies, December 2009, Springer Science + Business Media

    Professor Richard Leach

  75. Development and characterization of a new instrument for the traceable measurement of areal surface texture

    Article • Measurement Science and Technology, November 2009, Institute of Physics Publishing

    Professor Richard Leach

  76. Variation risk analysis: MEMS fabrication tolerance for a micro CMM probe

    Article • The International Journal of Advanced Manufacturing Technology, August 2009, Springer Science + Business Media

    Professor Richard Leach

  77. Dimensional nanometrology at the National Physical Laboratory

    Article • October 2008, SPIE

    Professor Richard Leach

  78. Adding a dynamic aspect to amplitude–wavelength space

    Article • Measurement Science and Technology, April 2008, Institute of Physics Publishing

    Professor Richard Leach

  79. The development of user-friendly software measurement standards for surface topography software assessment

    Article • Wear, March 2008, Elsevier

    Professor Richard Leach

  80. Recent advances in traceable nanoscale dimension and force metrology in the UK

    Article • Measurement Science and Technology, January 2006, Institute of Physics Publishing

    Professor Richard Leach

  81. PROPAGATION OF UNCERTAINTY IN DISCRETELY SAMPLED SURFACE ROUGHNESS PROFILES

    Article • January 2006, World Scientific Pub Co Pte Lt

    Professor Richard Leach

  82. Some issues of traceability in the field of surface topography measurement

    Article • Wear, December 2004, Elsevier

    Professor Richard Leach

  83. Ambiguities in the definition of spacing parameters for surface-texture characterization

    Article • Measurement Science and Technology, November 2002, Institute of Physics Publishing

    Professor Richard Leach

  84. NANOSCIENCE ADVANCES IN THE UK IN SUPPORT OF NANOTECHNOLOGY

    Article • International Journal of Nanoscience, April 2002, World Scientific Pub Co Pte Lt

    Professor Richard Leach

  85. Low-cost traceable dynamic calibration of surface texture measuring instruments

    Article • Measurement Science and Technology, November 2001, Institute of Physics Publishing

    Professor Richard Leach

  86. Advances in traceable nanometrology at the National Physical Laboratory †

    Article • Nanotechnology, November 2000, Institute of Physics Publishing

    Professor Richard Leach

  87. Traceable measurement of surface texture at the National Physical Laboratory using NanoSurf IV

    Article • Measurement Science and Technology, July 2000, Institute of Physics Publishing

    Professor Richard Leach

  88. Measurement of a correction for the phase change on reflection due to surface roughness

    Article • September 1998, SPIE

    Professor Richard Leach

  89. Towards a Traceable Infrastructure for Low Force Measurements

    Article • Springer Science + Business Media

    Professor Richard Leach

  90. Application of a DFμA Methodology to facilitate the assembly of a Micro/Nano Measurement Device

    Article • Springer Science + Business Media

    Professor Richard Leach