All Stories

  1. Electrical Characterization of MOCVD Grown Single Crystalline AlN Thin Films on 4H-SiC

    Article • Materials Science Forum, July 2019, Trans Tech Publications

    rabia khosa, Dr. Jawad Ul Hassan

  2. Conductance Signal from Near-Interface Traps in n-Type 4H-SiC MOS Capacitors under Strong Accumulation

    Article • Materials Science Forum, May 2017, Trans Tech Publications

    rabia khosa