All Stories

  1. A review of the most important failure, reliability and nonlinearity aspects in the development of microelectromechanical systems (MEMS)

    Article • Microelectronics International, January 2017, Emerald

    Dr. Peyman RAFIEE

  2. optically detected nonlinearity of single crytal silicon mems

    Article • Microelectronics International, May 2016, Emerald

    Dr. Peyman RAFIEE