All Stories

  1. X-ray investigation of strained epitaxial layer systems by reflections in skew geometry

    Article • Journal of Applied Crystallography, March 2017, International Union of Crystallography

    Dr. Peter Zaumseil

  2. SiGe nano-heteroepitaxy

    Article • Solid State Phenomena, October 2015, Trans Tech Publications

    Dr. Peter Zaumseil

  3. Tailoring the strain in Si nano-structures for defect-free epitaxial Ge over growth

    Article • Nanotechnology, August 2015, Institute of Physics Publishing

    Dr. Peter Zaumseil

  4. High-resolution characterization of the forbidden Si 200 and Si 222 reflections

    Article • Journal of Applied Crystallography, March 2015, International Union of Crystallography

    Dr. Peter Zaumseil