All Stories

  1. The Limits of X-ray Diffraction Theory

    Article • Crystals, March 2023, MDPI AG

    Dr Paul F Fewster

  2. Relating the measured intensities to those required for structure determination

    Article • Acta Crystallographica Section A Foundations and Advances, August 2018, International Union of Crystallography

    Dr Paul F Fewster

  3. Response to criticisms of the New Theory of X-ray Diffraction

    Article • Acta Crystallographica Section A Foundations and Advances, July 2018, International Union of Crystallography

    Dr Paul F Fewster

  4. What is an `ideally imperfect' crystal? Is kinematical theory appropriate?

    Article • Acta Crystallographica Section A Foundations and Advances, January 2016, International Union of Crystallography

    Dr Paul F Fewster

  5. A new theory for X-ray diffraction

    Article • Acta Crystallographica Section A Foundations and Advances, March 2014, International Union of Crystallography

    Dr Paul F Fewster

  6. Rapid identification of small powder samples.

    Article • Journal of Applied Crystallography, November 2013, International Union of Crystallography

    Dr Paul F Fewster

  7. High-resolution X-ray diffraction and imaging

    Article • Journal of Applied Crystallography, July 2013, International Union of Crystallography

    Dr Paul F Fewster

  8. X-Ray Scattering from Semiconductors and Other Materials

    Article • October 2012, World Scientific Pub Co Pte Lt

    Dr Paul F Fewster

  9. Crystalline Layer Structures with X-Ray Diffractometry

    Article • January 2010, Springer Science + Business Media

    Dr Paul F Fewster

  10. An icy mineralogy package (IMP) for in-situ studies of Titan’s surface

    Article • Advances in Space Research, July 2009, Elsevier

    Dr Paul F Fewster

  11. Crystal truncation rod X-ray scattering: exact dynamical calculation

    Article • Journal of Applied Crystallography, January 2008, International Union of Crystallography

    Dr Paul F Fewster

  12. High‐Resolution X‐ray Diffraction

    Article • October 2005, Wiley

    Dr Paul F Fewster

  13. A `static' high-resolution X-ray diffractometer

    Article • Journal of Applied Crystallography, January 2005, International Union of Crystallography

    Dr Paul F Fewster

  14. A `beam-selection' high-resolution X-ray diffractometer

    Article • Journal of Applied Crystallography, July 2004, International Union of Crystallography

    Dr Paul F Fewster

  15. Advances in the structural characterisation of semiconductor crystals by X-ray scattering methods

    Article • Progress in Crystal Growth and Characterization of Materials, January 2004, Elsevier

    Dr Paul F Fewster

  16. X-Ray Scattering from Semiconductors

    Article • July 2003, World Scientific Pub Co Pte Lt

    Dr Paul F Fewster

  17. X-Ray Scattering from Semiconductors

    Article • January 2003, World Scientific Pub Co Pte Lt

    Dr Paul F Fewster

  18. Detailed structural analysis of semiconductors with X-ray scattering

    Article • Materials Science in Semiconductor Processing, December 2001, Elsevier

    Dr Paul F Fewster

  19. X-Ray Scattering from Semiconductors

    Article • October 2000, World Scientific Pub Co Pte Lt

    Dr Paul F Fewster

  20. X-Ray Scattering from Semiconductors

    Article • January 2000, World Scientific Pub Co Pte Lt

    Dr Paul F Fewster

  21. .-

    Article • September 1999, Taylor & Francis

    Dr Paul F Fewster

  22. Strain analysis by X-ray diffraction

    Article • Thin Solid Films, April 1998, Elsevier

    Dr Paul F Fewster

  23. Reciprocal space mapping

    Article • Critical Reviews in Solid State and Material Sciences, June 1997, Taylor & Francis

    Dr Paul F Fewster

  24. X-ray analysis of thin films and multilayers

    Article • Reports on Progress in Physics, November 1996, Institute of Physics Publishing

    Dr Paul F Fewster

  25. Superlattices

    Article • January 1996, Springer Science + Business Media

    Dr Paul F Fewster

  26. Reciprocal Space Mapping

    Article • January 1996, Springer Science + Business Media

    Dr Paul F Fewster

  27. Thin layer diffraction

    Article • Journal de Physique III, September 1994, EDP Sciences

    Dr Paul F Fewster

  28. Determining the lattice relaxation in semiconductor layer systems by x-ray diffraction

    Article • Journal of Applied Physics, September 1993, American Institute of Physics

    Dr Paul F Fewster

  29. Multicrystal X-ray diffraction of heteroepitaxial structures

    Article • Applied Surface Science, June 1991, Elsevier

    Dr Paul F Fewster

  30. Hole-state reversal and the role of residual strain in (In,Ga)As-GaAs superlattices

    Article • May 1991, American Physical Society (APS)

    Dr Paul F Fewster

  31. Probing Semiconductor MQW Structures by X-Ray Diffraction

    Article • January 1987, Springer Science + Business Media

    Dr Paul F Fewster