All Stories

  1. Sub-micrometre depth-gradient measurements of phase, strain and texture in polycrystalline thin films: a nano-pencil beam diffraction approach

    Article • Journal of Applied Crystallography, February 2014, International Union of Crystallography

    Dr Nicolas R Vaxelaire

  2. X‐Ray Diffraction Analysis of Elastic Strains at the Nanoscale

    Article • November 2011, Wiley

    Dr Nicolas R Vaxelaire