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  1. Mass -selected ion beam generation using two rotating electric-field mass separation technique

    Article • AIP Advances, October 2023, American Institute of Physics

    Dr. Masashi Nojima

  2. Development of Mass-controlled Ion Beam through a Vacuum Electrospray Method

    Article • e-Journal of Surface Science and Nanotechnology, June 2022, Surface Science Society Japan

    Dr. Masashi Nojima

  3. X-ray photoelectron diffraction (XPED) and X-ray spectro-holography from the contributions of our instruments

    Article • Journal of Electron Spectroscopy and Related Phenomena, May 2022, Elsevier

    Dr. Masashi Nojima

  4. Mass Separation of Water Cluster Ion Beam Using Two Rotating Electric Fields and Sputtering of a Polymer Thin Film

    Article • e-Journal of Surface Science and Nanotechnology, March 2020, Surface Science Society Japan

    Dr. Masashi Nojima

  5. Method to measure the size distribution of massive cluster ion beams using two rotating electric fields

    Article • Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, October 2018, Elsevier

    Dr. Masashi Nojima

  6. Development of a mass spectrometer using two rotating electric fields

    Article • Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, March 2016, American Vacuum Society

    Dr. Masashi Nojima

  7. Development of Mass Spectrometer Using Two Rotating Electric Fields for Separation of High-Mass Ions

    Article • e-Journal of Surface Science and Nanotechnology, January 2016, Surface Science Society Japan

    Dr. Masashi Nojima

  8. Retracted: Mass analysis by Ar-GCIB-dynamic SIMS for organic materials

    Article • Surface and Interface Analysis, December 2014, Wiley

    Dr. Masashi Nojima

  9. Retracted: Mass analysis by Ar-GCIB-dynamic SIMS for organic materials

    Article • Surface and Interface Analysis, December 2014, Wiley

    Dr. Masashi Nojima

  10. Mass analysis by Ar-GCIB-dynamic SIMS for organic materials

    Article • Surface and Interface Analysis, November 2014, Wiley

    Dr. Masashi Nojima

  11. Development of organic SIMS system with Ar‐GCIB and IMS‐4f

    Article • Surface and Interface Analysis, November 2014, Wiley

    Dr. Masashi Nojima

  12. Development of Au-GCIB Dynamic SIMS and Cluster Size Filtering System

    Article • Microscopy and Microanalysis, August 2014, Oxford University Press (OUP)

    Dr. Masashi Nojima

  13. Dynamic SIMS Analysis of PEMFC Catalyst Layer/Solid Electrolyte Interfaces

    Article • ECS Transactions, March 2013, The Electrochemical Society

    Dr. Masashi Nojima

  14. Failure analysis of fine Cu patterning by shave‐off profiling

    Article • Surface and Interface Analysis, January 2011, Wiley

    Dr. Masashi Nojima

  15. Study on Sputtering Mechanism of Shave-off Profiling

    Article • e-Journal of Surface Science and Nanotechnology, January 2011, Surface Science Society Japan

    Dr. Masashi Nojima

  16. Present State of Development of Laser‐Assisted Wide Angle Three‐Dimensional Atom Probe

    Article • Surface and Interface Analysis, September 2010, Wiley

    Dr. Masashi Nojima

  17. A New Specimen Preparation Method for Three-Dimensional Atom Probe

    Article • e-Journal of Surface Science and Nanotechnology, January 2010, Surface Science Society Japan

    Dr. Masashi Nojima

  18. Development of Reconstruction Method for Highly Precise Shave-Off Depth Profiling

    Article • e-Journal of Surface Science and Nanotechnology, January 2010, Surface Science Society Japan

    Dr. Masashi Nojima

  19. Multilane shave-off profiling for build-up circuit

    Article • Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, February 2009, Elsevier

    Dr. Masashi Nojima

  20. Feasibility of a New Atom Probe Specimen Preparation Method Using a Focused Ion Beam

    Article • e-Journal of Surface Science and Nanotechnology, January 2009, Surface Science Society Japan

    Dr. Masashi Nojima

  21. Charge neutralization using secondary electron shower for shave-off depth profiling by focused ion beam secondary ion mass spectrometry

    Article • Applied Surface Science, December 2008, Elsevier

    Dr. Masashi Nojima

  22. Differential photoelectron holography of Cu(100) surface using laboratory‐level X‐ray sources

    Article • Surface and Interface Analysis, December 2008, Wiley

    Dr. Masashi Nojima

  23. Highly accurate shave-off depth profiling by simulation method

    Article • Applied Surface Science, December 2008, Elsevier

    Dr. Masashi Nojima

  24. Introduction of ice protective film for 3D microscale analysis of biological sample

    Article • Applied Surface Science, December 2008, Elsevier

    Dr. Masashi Nojima

  25. Shave-off vector profiling for TEM samples

    Article • Applied Surface Science, December 2008, Elsevier

    Dr. Masashi Nojima

  26. Study on dynamics of surface structure by rapid and time‐resolved X‐ray photoelectron diffraction

    Article • Surface and Interface Analysis, December 2008, Wiley

    Dr. Masashi Nojima

  27. Stress of needle specimen on the three‐dimensional atom probe (3DAP)

    Article • Surface and Interface Analysis, November 2008, Wiley

    Dr. Masashi Nojima

  28. Development of preset‐type sample stage in three‐dimensional atom probe

    Article • Surface and Interface Analysis, November 2008, Wiley

    Dr. Masashi Nojima

  29. Evaluation of the instrument for three‐dimensional atom probe (3DAP)

    Article • Surface and Interface Analysis, November 2008, Wiley

    Dr. Masashi Nojima

  30. Holographic imaging of TiO2 (110) surface structure by differential photoelectron holography

    Article • Surface and Interface Analysis, October 2008, Wiley

    Dr. Masashi Nojima

  31. Surface and interface structural analysis of VOX/TiO2 (110) by X‐ray photoelectron diffraction

    Article • Surface and Interface Analysis, June 2008, Wiley

    Dr. Masashi Nojima

  32. Reduction of Memory Effect in Shave-off Depth Profiling

    Article • BUNSEKI KAGAKU, January 2008, Japan Society for Analytical Chemistry

    Dr. Masashi Nojima

  33. Growth of Ultra-Thin MnSi Films on Si(111) Surface: Monte Carlo Simulation

    Article • e-Journal of Surface Science and Nanotechnology, January 2008, Surface Science Society Japan

    Dr. Masashi Nojima

  34. X-Ray Photoelectron Diffraction Study on the Surface and Interface Structure of VO2/TiO2(110) Model Catalyst

    Article • e-Journal of Surface Science and Nanotechnology, January 2008, Surface Science Society Japan

    Dr. Masashi Nojima

  35. Precise analysis on shave-off depth profiling

    Article • Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, May 2007, Elsevier

    Dr. Masashi Nojima

  36. Individual Ultrafine Particle Analysis in Urban Atmospheric Environment by Electron Probe Microanalysis

    Article • BUNSEKI KAGAKU, January 2007, Japan Society for Analytical Chemistry

    Dr. Masashi Nojima

  37. Handling of the ice protective film for potential use in the 3D microscale analysis of biological samples

    Article • Surface and Interface Analysis, November 2006, Wiley

    Dr. Masashi Nojima

  38. Improvement of a method for reconstructing the three‐dimensional atom probe (3DAP) data

    Article • Surface and Interface Analysis, November 2006, Wiley

    Dr. Masashi Nojima

  39. Pin point depth profiling for unit device or several nano‐devices

    Article • Surface and Interface Analysis, November 2006, Wiley

    Dr. Masashi Nojima

  40. Shave‐off depth profiling of dendritic short‐circuit growth caused by ion migration

    Article • Surface and Interface Analysis, November 2006, Wiley

    Dr. Masashi Nojima

  41. Shave‐off depth profiling of transparent conductive films and data analysis of the profile

    Article • Surface and Interface Analysis, November 2006, Wiley

    Dr. Masashi Nojima

  42. Surface structural analysis of h‐BN/Ni (111) by X‐ray photoelectron diffraction excited by Al Kα and Cr Lα lines

    Article • Surface and Interface Analysis, November 2006, Wiley

    Dr. Masashi Nojima

  43. Shave-off depth profiling: Depth profiling with an absolute depth scale

    Article • Applied Surface Science, July 2006, Elsevier

    Dr. Masashi Nojima

  44. Shave-Off Depth Profiling for Nano-Devices

    Article • Microchimica Acta, April 2006, Springer Science + Business Media

    Dr. Masashi Nojima

  45. Characterization of PM2.5 in the Indoor Environment by an Electron Probe Microanalysis Method

    Article • BUNSEKI KAGAKU, January 2005, Japan Society for Analytical Chemistry

    Dr. Masashi Nojima

  46. Evaluation of the nano-beam SIMS apparatus

    Article • Applied Surface Science, June 2004, Elsevier

    Dr. Masashi Nojima

  47. Evaluation of diesel exhaust particle pollution using the source apportionment of PM2.5 in an urban atmospheric environment

    Article • BUNSEKI KAGAKU, January 2004, Japan Society for Analytical Chemistry

    Dr. Masashi Nojima

  48. Surface structural analysis of monolayer films composed of light elements by x-ray photoelectron diffraction

    Article • Surface and Interface Analysis, January 2004, Wiley

    Dr. Masashi Nojima

  49. Development and estimation of a nano-beam secondary ion mass spectrometry apparatus.

    Article • BUNSEKI KAGAKU, January 2003, Japan Society for Analytical Chemistry

    Dr. Masashi Nojima

  50. Nanoscale SIMS analysis: the next generation in local analysis

    Article • Applied Surface Science, January 2003, Elsevier

    Dr. Masashi Nojima

  51. An Electrochemical Double Layer Capacitor Using an Activated Carbon Electrode with Gel Electrolyte Binder

    Article • Journal of The Electrochemical Society, May 1999, The Electrochemical Society

    Dr. Masashi Nojima

  52. Acetylene black/poly(vinylidene fluoride) gel electrolyte composite electrode for an electric double-layer capacitor

    Article • Journal of Power Sources, July 1998, Elsevier

    Dr. Masashi Nojima