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  1. In situ transmission electron microscopy of resistive switching in thin silicon oxide layers

    Article • Resolution and Discovery, November 2016, Akademiai Kiado

    Martial Duchamp

  2. Convenient Preparation of High-Quality Specimens for Annealing Experiments in the Transmission Electron Microscope

    Article • Microscopy and Microanalysis, November 2014, Oxford University Press (OUP)

    Martial Duchamp