All Stories

  1. Evaluation of Dynamic Triple Modular Redundancy in an Interleaved-Multi-Threading RISC-V Core

    Article • Journal of Low Power Electronics and Applications, December 2022, MDPI AG

    Prof. Marco Ottavi

  2. RISC-Vlim, a RISC-V Framework for Logic-in-Memory Architectures

    Article • Electronics, September 2022, MDPI AG

    Prof. Marco Ottavi

  3. Yield Evaluation of Faulty Memristive Crossbar Array-based Neural Networks with Repairability

    Article • September 2022, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  4. Is your FPGA bitstream Hardware Trojan-free? Machine learning can provide an answer

    Article • Journal of Systems Architecture, July 2022, Elsevier

    Prof. Marco Ottavi

  5. Processor Security: Detecting Microarchitectural Attacks via Count-Min Sketches

    Article • IEEE Transactions on Very Large Scale Integration (VLSI) Systems, July 2022, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  6. ERIC: An Efficient and Practical Software Obfuscation Framework

    Article • June 2022, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  7. Low power memristive gas sensor architectures with improved sensing accuracy

    Article • Journal of Computational Electronics, May 2022, Springer Science + Business Media

    Prof. Marco Ottavi

  8. Novel Applications Enabled by Memristors [Guest Editorial]

    Article • IEEE Nanotechnology Magazine, April 2022, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  9. Neutron irradiated perovskite films and solar cells on PET substrates

    Article • Nano Energy, March 2022, Elsevier

    Prof. Marco Ottavi, Dr. Vishal Gupta

  10. A Conditionally Chaotic Physically Unclonable Function Design Framework with High Reliability

    Article • ACM Transactions on Design Automation of Electronic Systems, November 2021, ACM (Association for Computing Machinery)

    Prof. Marco Ottavi

  11. A Lightweight Security Checking Module to Protect Microprocessors against Hardware Trojan Horses

    Article • October 2021, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  12. Reliability Assessment of Memristor based Gas Sensor Array

    Article • October 2021, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi, Dr. Vishal Gupta

  13. A Memristive Architecture for Process Variation Aware Gas Sensing and Logic Operations

    Article • June 2021, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  14. Soft Error Tolerant Count Min Sketches

    Article • IEEE Transactions on Computers, February 2021, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  15. A memristor-based sensing and repair system for photovoltaic modules

    Article • Microelectronics Reliability, February 2021, Elsevier

    Prof. Marco Ottavi

  16. Guest Editorial: IEEE Transactions on Emerging Topics in Computing Special Issue on Advanced Command, Control and On-Board Data Processing for Space Avionic Systems

    Article • IEEE Transactions on Emerging Topics in Computing, January 2021, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  17. Sensing with Memristive Complementary Resistive Switch: Modelling and Simulations

    Article • October 2020, Institute of Electrical & Electronics Engineers (IEEE)

    Dr. Vishal Gupta, Prof. Marco Ottavi

  18. Foreword

    Article • October 2020, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  19. Investigation of hysteresis in hole transport layer free metal halide perovskites cells under dark conditions

    Article • Nanotechnology, August 2020, Institute of Physics Publishing

    Dr. Vishal Gupta, Prof. Marco Ottavi

  20. Characterisation & modelling of perovskite-based synaptic memristor device

    Article • Microelectronics Reliability, August 2020, Elsevier

    Dr. Vishal Gupta, Prof. Marco Ottavi

  21. Yield Estimation of a Memristive Sensor Array

    Article • July 2020, Institute of Electrical & Electronics Engineers (IEEE)

    Dr. Vishal Gupta, Prof. Marco Ottavi

  22. A Microprocessor Protection Architecture against Hardware Trojans in Memories

    Article • April 2020, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  23. On-Board Satellite Telemetry Forecasting with RNN on RISC-V Based Multicore Processor

    Article • January 2020, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  24. Characterization of a RISC-V Microcontroller Through Fault Injection

    Article • January 2020, Springer Science + Business Media

    Prof. Marco Ottavi

  25. Fault Tolerant Photovoltaic Array: A Repair Circuit Based on Memristor Sensing

    Article • October 2019, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  26. Fault Modeling and Simulation of Memristor based Gas Sensors

    Article • July 2019, Institute of Electrical & Electronics Engineers (IEEE)

    Dr. Vishal Gupta, Prof. Marco Ottavi

  27. The Missing Applications Found: Robust Design Techniques and Novel Uses of Memristors

    Article • July 2019, Institute of Electrical & Electronics Engineers (IEEE)

    Dr. Vishal Gupta, Prof. Marco Ottavi

  28. Design and Implementation of a Flexible Interface for TID Detector

    Article • June 2019, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  29. Full characterization of a compact 90Sr/90Y beta source for TID radiation testing

    Article • Advances in Space Research, May 2019, Elsevier

    Prof. Marco Ottavi

  30. Perovskite based Low Power Synaptic Memristor Device for Neuromorphic application

    Article • April 2019, Institute of Electrical & Electronics Engineers (IEEE)

    Dr. Vishal Gupta, Prof. Marco Ottavi

  31. Memristor Based Planar Tunable RF Circuits

    Article • Journal of Circuits System and Computers, February 2019, World Scientific Pub Co Pte Lt

    Prof. Marco Ottavi

  32. The Case for RISC-V in Space

    Article • January 2019, Springer Science + Business Media

    Prof. Marco Ottavi

  33. Towards defining a simplified procedure for COTS system-on-chip TID testing

    Article • Nuclear Engineering and Technology, December 2018, Elsevier

    Prof. Marco Ottavi

  34. 45nm Bit-Interleaving Differential 10T Low Leakage FinFET Based SRAM with Column-Wise Write Access Control

    Article • October 2018, Institute of Electrical & Electronics Engineers (IEEE)

    Dr. Vishal Gupta, Prof. Marco Ottavi

  35. Complementary Resistive Switch Sensing

    Article • October 2018, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  36. Foreword

    Article • October 2018, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  37. Neutron irradiation of an ARM Cortex-M0 Core

    Article • September 2018, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  38. Opcode vector: An efficient scheme to detect soft errors in instructions

    Article • Microelectronics Reliability, July 2018, Elsevier

    Prof. Marco Ottavi

  39. Simplified Procedures for COTS TID Testing: A Comparison Between 90Sr and 60Co

    Article • July 2018, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  40. Efficient sensing approaches for high-density memristor sensor array

    Article • Journal of Computational Electronics, April 2018, Springer Science + Business Media

    Prof. Marco Ottavi

  41. Memristor based adaptive impedance and frequency tuning network

    Article • April 2018, Institute of Electrical & Electronics Engineers (IEEE)

    Dr. Vishal Gupta, Prof. Marco Ottavi

  42. Guest Editorial: <italic>IEEE Transactions on Emerging Topics in Computing</italic> Special Issue on Design & Technology of Integrated Systems in Deep Submicron Era

    Article • IEEE Transactions on Emerging Topics in Computing, April 2018, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  43. Setup and experimental results analysis of COTS Camera and SRAMs at the ISIS neutron facility

    Article • April 2018, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  44. Two dimensional FFT architecture based on radix-43 algorithm with efficient output reordering

    Article • April 2018, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  45. A Double Error Correction Code for 32-Bit Data Words With Efficent Decoding

    Article • IEEE Transactions on Device and Materials Reliability, March 2018, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  46. Dependable Multicore Architectures at Nanoscale

    Article • January 2018, Springer Science + Business Media

    Prof. Marco Ottavi

  47. Detecting errors in instructions with bloom filters

    Article • October 2017, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  48. High-energy neutrons characterization of a safety critical computing system

    Article • October 2017, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  49. Racetrack Logic

    Article • Electronics Letters, September 2017, the Institution of Engineering and Technology (the IET)

    Prof. Marco Ottavi

  50. Reliable gas sensing with memristive array

    Article • July 2017, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  51. Guest Editorial: IEEE Transactions on Computers and IEEE Transactions on Emerging Topics in Computing Joint Special Section on Innovation in Reconfigurable Computing Fabrics from Devices to Architectures

    Article • IEEE Transactions on Computers, June 2017, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  52. Guest Editorial: IEEE Transactions on Computers and IEEE Transactions on Emerging Topics in Computing Joint Special Section on Innovation in Reconfigurable Computing Fabrics from Devices to Architectures

    Article • IEEE Transactions on Emerging Topics in Computing, April 2017, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  53. Design and characterization of a high-safety hardware/software module for the acquisition of Eurobalise telegrams

    Article • September 2016, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Rocco Fazzolari, Prof. Marco Ottavi

  54. A novel method for SEE validation of complex SoCs using Low-Energy Proton beams

    Article • September 2016, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  55. Low Cost Memristor Associative Memory Design for Full and Partial Matching Applications

    Article • IEEE Transactions on Nanotechnology, May 2016, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  56. Qualitative techniques for System-on-Chip test with low-energy protons

    Article • April 2016, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  57. Complementary Resistive Switch-Based Arithmetic Logic Implementations Using Material Implication

    Article • IEEE Transactions on Nanotechnology, January 2016, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  58. A method to protect Bloom filters from soft errors

    Article • October 2015, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  59. Characterization of low power radiation-hard reed-solomon code protected serializers in 65-nm for HEP experiments electronics

    Article • October 2015, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  60. Enhancing embedded SRAM security and error tolerance with hardware CRC and obfuscation

    Article • October 2015, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  61. Fault detection and repair of DSC arrays through memristor sensing

    Article • October 2015, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  62. Low Delay Single Symbol Error Correction Codes Based on Reed Solomon Codes

    Article • IEEE Transactions on Computers, May 2015, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  63. 2T2M memristor based TCAM cell for low power applications

    Article • April 2015, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  64. Dependable Multicore Architectures at Nanoscale: The View From Europe

    Article • IEEE Design and Test, April 2015, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  65. A Synergetic Use of Bloom Filters for Error Detection and Correction

    Article • IEEE Transactions on Very Large Scale Integration (VLSI) Systems, March 2015, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  66. Novel Complementary Resistive Switch Crossbar Memory Write and Read Schemes

    Article • IEEE Transactions on Nanotechnology, March 2015, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  67. Lifetime Reliability Analysis of Complementary Resistive Switches Under Threshold and Doping Interface Speed Variations

    Article • IEEE Transactions on Nanotechnology, January 2015, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  68. Total Ionizing Dose Effects on DRAM Data Retention Time

    Article • IEEE Transactions on Nuclear Science, December 2014, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  69. Characterization of data retention faults in DRAM devices

    Article • October 2014, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  70. [Front matter]

    Article • October 2014, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  71. Using memristor state change behavior to identify faults in photovoltaic arrays

    Article • October 2014, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  72. FastTag: A Technique to Protect Cache Tags Against Soft Errors

    Article • IEEE Transactions on Device and Materials Reliability, September 2014, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  73. A Single-Bit and Double-Adjacent Error Correcting Parallel Decoder for Multiple-Bit Error Correcting BCH Codes

    Article • IEEE Transactions on Device and Materials Reliability, June 2014, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  74. Design and Analysis of Single-Event Tolerant Slave Latches for Enhanced Scan Delay Testing

    Article • IEEE Transactions on Device and Materials Reliability, March 2014, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  75. Design of a Nanometric CMOS Memory Cell for Hardening to a Single Event With a Multiple-Node Upset

    Article • IEEE Transactions on Device and Materials Reliability, March 2014, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  76. A 20 mW, 4.8 Gbit/sec, SEU robust serializer in 65nm for read-out of data from LHC experiments

    Article • Journal of Instrumentation, January 2014, Institute of Physics Publishing

    Prof. Marco Ottavi

  77. Complementary resistive switch based stateful logic operations using material implication

    Article • January 2014, EDAA

    Prof. Marco Ottavi

  78. Efficient implementation of error correction codes in hash tables

    Article • Microelectronics Reliability, January 2014, Elsevier

    Prof. Marco Ottavi

  79. F-DICE: A multiple node upset tolerant flip-flop for highly radioactive environments

    Article • October 2013, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  80. Reducing the Cost of Single Error Correction With Parity Sharing

    Article • IEEE Transactions on Device and Materials Reliability, September 2013, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  81. Introduction to the Special Section

    Article • IEEE Transactions on Nanotechnology, July 2013, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  82. Reducing the Cost of Implementing Error Correction Codes in Content Addressable Memories

    Article • IEEE Transactions on Circuits & Systems II Express Briefs, July 2013, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  83. Error Detection and Correction in Content Addressable Memories by Using Bloom Filters

    Article • IEEE Transactions on Computers, June 2013, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  84. A Method to Construct Low Delay Single Error Correction Codes for Protecting Data Bits Only

    Article • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, March 2013, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  85. High-reliability fault tolerant digital systems in nanometric technologies: Characterization and design methodologies

    Article • October 2012, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  86. On the design of two single event tolerant slave latches for scan delay testing

    Article • October 2012, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  87. Introducing MEDIAN: A new COST Action on manufacturable and dependable multicore architectures at nanoscale

    Article • May 2012, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  88. Low-cost single error correction multiple adjacent error correction codes

    Article • Electronics Letters, January 2012, the Institution of Engineering and Technology (the IET)

    Prof. Marco Ottavi

  89. Partially Reversible Pipelined QCA Circuits: Combining Low Power With High Throughput

    Article • IEEE Transactions on Nanotechnology, November 2011, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  90. On the Effects of Intra-gate Resistive Open Defects in Gates at Nanoscaled CMOS

    Article • October 2011, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  91. Error Detection and Correction in Content Addressable Memories

    Article • October 2010, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  92. Modeling Open Defects in Nanometric Scale CMOS

    Article • October 2010, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  93. High throughput and low power dissipation in QCA pipelines using Bennett clocking

    Article • June 2010, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  94. Modeling and Evaluating Errors Due to Random Clock Shifts in Quantum-Dot Cellular Automata Circuits

    Article • Journal of Electronic Testing, September 2008, Springer Science + Business Media

    Prof. Marco Ottavi

  95. A Serial Memory by Quantum-Dot Cellular Automata (QCA)

    Article • IEEE Transactions on Computers, May 2008, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  96. Analysis and Evaluations of Reliability of Reconfigurable FPGAs

    Article • Journal of Electronic Testing, January 2008, Springer Science + Business Media

    Prof. Marco Ottavi

  97. Two-Dimensional Schemes for Clocking/Timing of QCA Circuits

    Article • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, January 2008, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  98. On the Error Effects of Random Clock Shifts in Quantum-dot Cellular Automata Circuits

    Article • September 2007, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  99. QCA Circuits for Robust Coplanar Crossing

    Article • Journal of Electronic Testing, March 2007, Springer Science + Business Media

    Prof. Marco Ottavi

  100. Design and Evaluation of a Hardware on-line Program-Flow Checker for Embedded Microcontrollers

    Article • October 2006, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  101. Evaluating the Yield of Repairable SRAMs for ATE

    Article • IEEE Transactions on Instrumentation and Measurement, October 2006, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  102. HDLQ

    Article • ACM Journal on Emerging Technologies in Computing Systems, October 2006, ACM (Association for Computing Machinery)

    Prof. Marco Ottavi

  103. Reliability Evaluation of Repairable/Reconfigurable FPGAs

    Article • October 2006, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  104. Fault localization, error correction, and graceful degradation in radix 2 signed digit-based adders

    Article • IEEE Transactions on Computers, May 2006, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  105. QCA memory with parallel read∕serial write: design and analysis

    Article • IEE Proceedings - Circuits Devices and Systems, January 2006, the Institution of Engineering and Technology (the IET)

    Prof. Marco Ottavi

  106. A Line-Based Parallel Memory for QCA Implementation

    Article • IEEE Transactions on Nanotechnology, November 2005, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  107. Fault tolerant solid state mass memory for space applications

    Article • IEEE Transactions on Aerospace and Electronic Systems, October 2005, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  108. Tile-based QCA design using majority-like logic primitives

    Article • ACM Journal on Emerging Technologies in Computing Systems, October 2005, ACM (Association for Computing Machinery)

    Prof. Marco Ottavi

  109. A Comparative Evaluation of Designs for Reliable Memory Systems

    Article • Journal of Electronic Testing, August 2005, Springer Science + Business Media

    Prof. Marco Ottavi

  110. Estimating the Manufacturing Yield of Compiler-Based Embedded SRAMs

    Article • IEEE Transactions on Semiconductor Manufacturing, August 2005, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  111. Markov models of fault-tolerant memory systems under SEU

    Article • January 2004, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  112. Design of a fault tolerant solid state mass memory

    Article • IEEE Transactions on Reliability, December 2003, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  113. Localization of Faults in Radix-n Signed Digit Adders

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  114. Design of a QCA Memory with Parallel Read/Serial Write

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  115. Evaluating the Data Integrity of Memory Systems by Configurable Markov Models

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  116. Novel memory designs for QCA implementation

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  117. On the Analysis of Reed Solomon Coding for Resilience to Transient/Permanent Faults in Highly Reliable Memories

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  118. A fault-tolerant solid state mass memory for highly reliable instrumentation

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  119. A signed digit adder with error correction and graceful degradation capabilities

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  120. On the yield of compiler-based eSRAMs

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  121. Yield evaluation methods of SRAM arrays: a comparative study

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  122. Bit flip injection in processor-based architectures: a case study

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  123. Development of a dynamic routing system for a fault tolerant solid state mass memory

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi