All Stories

  1. A Single-Cycle, Area-Efficient Calibration Method for TDC-based Timing Monitors

    Article • May 2026, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  2. Efficient Hash-to-Index via Rejection Sampling for Online Fault Detection with Bloom/Cuckoo Filters

    Article • May 2026, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  3. AMPEREISH: Approximate Multipliers for Power Efficiency in FPGA Designs Using Internal-Self-Healing

    Article • IEEE Access, January 2026, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  4. Instruction Error Detection with Bloom Filters: Architecture, Radiation Testing and Fault Injection

    Article • IEEE Transactions on Device and Materials Reliability, January 2026, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  5. Trikarenos: Design and Experimental Characterization of a Fault-Tolerant 28-nm RISC-V-Based SoC

    Article • IEEE Transactions on Nuclear Science, August 2025, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  6. Memristor based Gas Sensor: Sensitivity and Timing Analysis

    Article • July 2025, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi, Dr. Vishal Gupta

  7. Bloom Filters for Soft Error Detection: Neutron and Fault Injection Validation

    Article • July 2025, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  8. Neutron Resilience of Flexible Perovskite Solar Cells Using PTAA‐Derived Hole Transport Layers

    Article • Solar RRL, July 2025, Wiley

    Prof. Marco Ottavi

  9. The online reconfiguration of a distributed on-board computer: The time and network behaviour of a dependable scheduling algorithm

    Article • Journal of Systems Architecture, July 2025, Elsevier

    Prof. Marco Ottavi

  10. TrackScorer: Skyrmion Logic-in-Memory Accelerator for Tree-Based Ranking Models

    Article • March 2025, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  11. From Ground to Orbit: A Robust and Efficient Test Methodology for RISC-V Soft-Cores

    Article • IEEE Transactions on Device and Materials Reliability, March 2025, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  12. Towards Approximate Computing for Deep Learning in Embedded Systems – A Systematic Literature Review

    Article • IEEE Access, January 2025, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  13. An Enhanced Fault Injection Framework for FPGA-Based Soft-Cores

    Article • October 2024, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  14. An Experimental Comparison of RISC-V Processors: Performance, Power, Area and Security - Special Session Paper-

    Article • October 2024, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  15. Divertor Tokamak Test facility project: status of design and implementation

    Article • Nuclear Fusion, September 2024, Institute of Physics Publishing

    Prof. Marco Ottavi, Professor Domenic D'Ambrosio

  16. Neutron Beam Evaluation of Probabilistic Data Structure-based Online Checkers

    Article • July 2024, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  17. Towards the Online Reconfiguration of a Dependable Distributed On-Board Computer

    Article • January 2024, Springer Science + Business Media

    Prof. Marco Ottavi

  18. Computer Security – ESORICS 2023

    Article • January 2024, Springer Science + Business Media

    Prof. Marco Ottavi

  19. Built-in Software Obfuscation for Protecting Microprocessors against Hardware Trojan Horses

    Article • October 2023, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  20. Improving the Detection of Hardware Trojan Horses in Microprocessors via Hamming Codes

    Article • October 2023, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  21. Neutron Radiation Tests of the NEORV32 RISC-V SoC on Flash-Based FPGAs

    Article • October 2023, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  22. Towards Dependable RISC-V Cores for Edge Computing Devices

    Article • July 2023, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  23. An unprotected RISC-V Soft-core processor on an SRAM FPGA: Is it as bad as it sounds?

    Article • May 2023, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  24. DEV-PIM: Dynamic Execution Validation with Processing-in-Memory

    Article • May 2023, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  25. Evaluation of Dynamic Triple Modular Redundancy in an Interleaved-Multi-Threading RISC-V Core

    Article • Journal of Low Power Electronics and Applications, December 2022, MDPI AG

    Prof. Marco Ottavi

  26. Preventing Soft Errors and Hardware Trojans in RISC-V Cores

    Article • October 2022, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  27. Is RISC-V ready for Space? A Security Perspective

    Article • October 2022, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  28. RISC-Vlim, a RISC-V Framework for Logic-in-Memory Architectures

    Article • Electronics, September 2022, MDPI AG

    Prof. Marco Ottavi

  29. Yield Evaluation of Faulty Memristive Crossbar Array-based Neural Networks with Repairability

    Article • September 2022, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  30. Is your FPGA bitstream Hardware Trojan-free? Machine learning can provide an answer

    Article • Journal of Systems Architecture, July 2022, Elsevier

    Prof. Marco Ottavi

  31. Processor Security: Detecting Microarchitectural Attacks via Count-Min Sketches

    Article • IEEE Transactions on Very Large Scale Integration (VLSI) Systems, July 2022, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  32. ERIC: An Efficient and Practical Software Obfuscation Framework

    Article • June 2022, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  33. Low power memristive gas sensor architectures with improved sensing accuracy

    Article • Journal of Computational Electronics, May 2022, Springer Science + Business Media

    Prof. Marco Ottavi

  34. Novel Applications Enabled by Memristors [Guest Editorial]

    Article • IEEE Nanotechnology Magazine, April 2022, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  35. Neutron irradiated perovskite films and solar cells on PET substrates

    Article • Nano Energy, March 2022, Elsevier

    Prof. Marco Ottavi, Dr. Vishal Gupta

  36. A Conditionally Chaotic Physically Unclonable Function Design Framework with High Reliability

    Article • ACM Transactions on Design Automation of Electronic Systems, November 2021, ACM (Association for Computing Machinery)

    Prof. Marco Ottavi

  37. A Lightweight Security Checking Module to Protect Microprocessors against Hardware Trojan Horses

    Article • October 2021, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  38. Reliability Assessment of Memristor based Gas Sensor Array

    Article • October 2021, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi, Dr. Vishal Gupta

  39. A Memristive Architecture for Process Variation Aware Gas Sensing and Logic Operations

    Article • June 2021, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  40. Soft Error Tolerant Count Min Sketches

    Article • IEEE Transactions on Computers, February 2021, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  41. A memristor-based sensing and repair system for photovoltaic modules

    Article • Microelectronics Reliability, February 2021, Elsevier

    Prof. Marco Ottavi

  42. Guest Editorial: IEEE Transactions on Emerging Topics in Computing Special Issue on Advanced Command, Control and On-Board Data Processing for Space Avionic Systems

    Article • IEEE Transactions on Emerging Topics in Computing, January 2021, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  43. Sensing with Memristive Complementary Resistive Switch: Modelling and Simulations

    Article • October 2020, Institute of Electrical & Electronics Engineers (IEEE)

    Dr. Vishal Gupta, Prof. Marco Ottavi

  44. Foreword

    Article • October 2020, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  45. Investigation of hysteresis in hole transport layer free metal halide perovskites cells under dark conditions

    Article • Nanotechnology, August 2020, Institute of Physics Publishing

    Dr. Vishal Gupta, Prof. Marco Ottavi

  46. Characterisation & modelling of perovskite-based synaptic memristor device

    Article • Microelectronics Reliability, August 2020, Elsevier

    Dr. Vishal Gupta, Prof. Marco Ottavi

  47. Yield Estimation of a Memristive Sensor Array

    Article • July 2020, Institute of Electrical & Electronics Engineers (IEEE)

    Dr. Vishal Gupta, Prof. Marco Ottavi

  48. A Microprocessor Protection Architecture against Hardware Trojans in Memories

    Article • April 2020, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  49. On-Board Satellite Telemetry Forecasting with RNN on RISC-V Based Multicore Processor

    Article • January 2020, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  50. Characterization of a RISC-V Microcontroller Through Fault Injection

    Article • January 2020, Springer Science + Business Media

    Prof. Marco Ottavi

  51. Fault Tolerant Photovoltaic Array: A Repair Circuit Based on Memristor Sensing

    Article • October 2019, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  52. Fault Modeling and Simulation of Memristor based Gas Sensors

    Article • July 2019, Institute of Electrical & Electronics Engineers (IEEE)

    Dr. Vishal Gupta, Prof. Marco Ottavi

  53. The Missing Applications Found: Robust Design Techniques and Novel Uses of Memristors

    Article • July 2019, Institute of Electrical & Electronics Engineers (IEEE)

    Dr. Vishal Gupta, Prof. Marco Ottavi

  54. Design and Implementation of a Flexible Interface for TID Detector

    Article • June 2019, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  55. Full characterization of a compact 90Sr/90Y beta source for TID radiation testing

    Article • Advances in Space Research, May 2019, Elsevier

    Prof. Marco Ottavi

  56. Perovskite based Low Power Synaptic Memristor Device for Neuromorphic application

    Article • April 2019, Institute of Electrical & Electronics Engineers (IEEE)

    Dr. Vishal Gupta, Prof. Marco Ottavi

  57. Memristor Based Planar Tunable RF Circuits

    Article • Journal of Circuits System and Computers, February 2019, World Scientific Pub Co Pte Lt

    Prof. Marco Ottavi

  58. The Case for RISC-V in Space

    Article • January 2019, Springer Science + Business Media

    Prof. Marco Ottavi

  59. Towards defining a simplified procedure for COTS system-on-chip TID testing

    Article • Nuclear Engineering and Technology, December 2018, Elsevier

    Prof. Marco Ottavi

  60. 45nm Bit-Interleaving Differential 10T Low Leakage FinFET Based SRAM with Column-Wise Write Access Control

    Article • October 2018, Institute of Electrical & Electronics Engineers (IEEE)

    Dr. Vishal Gupta, Prof. Marco Ottavi

  61. Complementary Resistive Switch Sensing

    Article • October 2018, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  62. Foreword

    Article • October 2018, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  63. Neutron irradiation of an ARM Cortex-M0 Core

    Article • September 2018, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  64. Opcode vector: An efficient scheme to detect soft errors in instructions

    Article • Microelectronics Reliability, July 2018, Elsevier

    Prof. Marco Ottavi

  65. Simplified Procedures for COTS TID Testing: A Comparison Between 90Sr and 60Co

    Article • July 2018, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  66. Efficient sensing approaches for high-density memristor sensor array

    Article • Journal of Computational Electronics, April 2018, Springer Science + Business Media

    Prof. Marco Ottavi

  67. Memristor based adaptive impedance and frequency tuning network

    Article • April 2018, Institute of Electrical & Electronics Engineers (IEEE)

    Dr. Vishal Gupta, Prof. Marco Ottavi

  68. Guest Editorial: <italic>IEEE Transactions on Emerging Topics in Computing</italic> Special Issue on Design & Technology of Integrated Systems in Deep Submicron Era

    Article • IEEE Transactions on Emerging Topics in Computing, April 2018, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  69. Setup and experimental results analysis of COTS Camera and SRAMs at the ISIS neutron facility

    Article • April 2018, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  70. Two dimensional FFT architecture based on radix-43 algorithm with efficient output reordering

    Article • April 2018, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  71. A Double Error Correction Code for 32-Bit Data Words With Efficent Decoding

    Article • IEEE Transactions on Device and Materials Reliability, March 2018, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  72. Dependable Multicore Architectures at Nanoscale

    Article • January 2018, Springer Science + Business Media

    Prof. Marco Ottavi

  73. Detecting errors in instructions with bloom filters

    Article • October 2017, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  74. High-energy neutrons characterization of a safety critical computing system

    Article • October 2017, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  75. Racetrack Logic

    Article • Electronics Letters, September 2017, the Institution of Engineering and Technology (the IET)

    Prof. Marco Ottavi

  76. Reliable gas sensing with memristive array

    Article • July 2017, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  77. Guest Editorial: IEEE Transactions on Computers and IEEE Transactions on Emerging Topics in Computing Joint Special Section on Innovation in Reconfigurable Computing Fabrics from Devices to Architectures

    Article • IEEE Transactions on Computers, June 2017, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  78. Guest Editorial: IEEE Transactions on Computers and IEEE Transactions on Emerging Topics in Computing Joint Special Section on Innovation in Reconfigurable Computing Fabrics from Devices to Architectures

    Article • IEEE Transactions on Emerging Topics in Computing, April 2017, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  79. Design and characterization of a high-safety hardware/software module for the acquisition of Eurobalise telegrams

    Article • September 2016, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Rocco Fazzolari, Prof. Marco Ottavi

  80. A novel method for SEE validation of complex SoCs using Low-Energy Proton beams

    Article • September 2016, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  81. Low Cost Memristor Associative Memory Design for Full and Partial Matching Applications

    Article • IEEE Transactions on Nanotechnology, May 2016, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  82. Qualitative techniques for System-on-Chip test with low-energy protons

    Article • April 2016, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  83. Complementary Resistive Switch-Based Arithmetic Logic Implementations Using Material Implication

    Article • IEEE Transactions on Nanotechnology, January 2016, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  84. A method to protect Bloom filters from soft errors

    Article • October 2015, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  85. Characterization of low power radiation-hard reed-solomon code protected serializers in 65-nm for HEP experiments electronics

    Article • October 2015, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  86. Enhancing embedded SRAM security and error tolerance with hardware CRC and obfuscation

    Article • October 2015, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  87. Fault detection and repair of DSC arrays through memristor sensing

    Article • October 2015, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  88. Low Delay Single Symbol Error Correction Codes Based on Reed Solomon Codes

    Article • IEEE Transactions on Computers, May 2015, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  89. 2T2M memristor based TCAM cell for low power applications

    Article • April 2015, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  90. Dependable Multicore Architectures at Nanoscale: The View From Europe

    Article • IEEE Design and Test, April 2015, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  91. A Synergetic Use of Bloom Filters for Error Detection and Correction

    Article • IEEE Transactions on Very Large Scale Integration (VLSI) Systems, March 2015, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  92. Novel Complementary Resistive Switch Crossbar Memory Write and Read Schemes

    Article • IEEE Transactions on Nanotechnology, March 2015, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  93. Lifetime Reliability Analysis of Complementary Resistive Switches Under Threshold and Doping Interface Speed Variations

    Article • IEEE Transactions on Nanotechnology, January 2015, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  94. Total Ionizing Dose Effects on DRAM Data Retention Time

    Article • IEEE Transactions on Nuclear Science, December 2014, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  95. Characterization of data retention faults in DRAM devices

    Article • October 2014, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  96. [Front matter]

    Article • October 2014, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  97. Using memristor state change behavior to identify faults in photovoltaic arrays

    Article • October 2014, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  98. FastTag: A Technique to Protect Cache Tags Against Soft Errors

    Article • IEEE Transactions on Device and Materials Reliability, September 2014, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  99. A Single-Bit and Double-Adjacent Error Correcting Parallel Decoder for Multiple-Bit Error Correcting BCH Codes

    Article • IEEE Transactions on Device and Materials Reliability, June 2014, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  100. Design and Analysis of Single-Event Tolerant Slave Latches for Enhanced Scan Delay Testing

    Article • IEEE Transactions on Device and Materials Reliability, March 2014, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  101. Design of a Nanometric CMOS Memory Cell for Hardening to a Single Event With a Multiple-Node Upset

    Article • IEEE Transactions on Device and Materials Reliability, March 2014, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  102. A 20 mW, 4.8 Gbit/sec, SEU robust serializer in 65nm for read-out of data from LHC experiments

    Article • Journal of Instrumentation, January 2014, Institute of Physics Publishing

    Prof. Marco Ottavi

  103. Complementary resistive switch based stateful logic operations using material implication

    Article • January 2014, EDAA

    Prof. Marco Ottavi

  104. Efficient implementation of error correction codes in hash tables

    Article • Microelectronics Reliability, January 2014, Elsevier

    Prof. Marco Ottavi

  105. Complementary resistive switch based stateful logic operations using material implication

    Article • January 2014, EDAA

    Prof. Marco Ottavi

  106. F-DICE: A multiple node upset tolerant flip-flop for highly radioactive environments

    Article • October 2013, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  107. Reducing the Cost of Single Error Correction With Parity Sharing

    Article • IEEE Transactions on Device and Materials Reliability, September 2013, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  108. Introduction to the Special Section

    Article • IEEE Transactions on Nanotechnology, July 2013, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  109. Reducing the Cost of Implementing Error Correction Codes in Content Addressable Memories

    Article • IEEE Transactions on Circuits & Systems II Express Briefs, July 2013, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  110. Error Detection and Correction in Content Addressable Memories by Using Bloom Filters

    Article • IEEE Transactions on Computers, June 2013, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  111. A Method to Construct Low Delay Single Error Correction Codes for Protecting Data Bits Only

    Article • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, March 2013, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  112. Error Detection in Ternary CAMs Using Bloom Filters

    Article • January 2013, EDAA

    Prof. Marco Ottavi

  113. High-reliability fault tolerant digital systems in nanometric technologies: Characterization and design methodologies

    Article • October 2012, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  114. On the design of two single event tolerant slave latches for scan delay testing

    Article • October 2012, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  115. Introducing MEDIAN: A new COST Action on manufacturable and dependable multicore architectures at nanoscale

    Article • May 2012, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  116. Low-cost single error correction multiple adjacent error correction codes

    Article • Electronics Letters, January 2012, the Institution of Engineering and Technology (the IET)

    Prof. Marco Ottavi

  117. Partially Reversible Pipelined QCA Circuits: Combining Low Power With High Throughput

    Article • IEEE Transactions on Nanotechnology, November 2011, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  118. On the Effects of Intra-gate Resistive Open Defects in Gates at Nanoscaled CMOS

    Article • October 2011, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  119. Modeling magnetic quantum-dot cellular automata by HDL

    Article • August 2011, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  120. Feedback based droop mitigation

    Article • March 2011, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  121. Error Detection and Correction in Content Addressable Memories

    Article • October 2010, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  122. Modeling Open Defects in Nanometric Scale CMOS

    Article • October 2010, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  123. High throughput and low power dissipation in QCA pipelines using Bennett clocking

    Article • June 2010, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  124. Modeling and Evaluating Errors Due to Random Clock Shifts in Quantum-Dot Cellular Automata Circuits

    Article • Journal of Electronic Testing, September 2008, Springer Science + Business Media

    Prof. Marco Ottavi

  125. A Serial Memory by Quantum-Dot Cellular Automata (QCA)

    Article • IEEE Transactions on Computers, May 2008, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  126. Analysis and Evaluations of Reliability of Reconfigurable FPGAs

    Article • Journal of Electronic Testing, January 2008, Springer Science + Business Media

    Prof. Marco Ottavi

  127. Two-Dimensional Schemes for Clocking/Timing of QCA Circuits

    Article • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, January 2008, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  128. On the Error Effects of Random Clock Shifts in Quantum-dot Cellular Automata Circuits

    Article • September 2007, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  129. QCA Circuits for Robust Coplanar Crossing

    Article • Journal of Electronic Testing, March 2007, Springer Science + Business Media

    Prof. Marco Ottavi

  130. Design and Evaluation of a Hardware on-line Program-Flow Checker for Embedded Microcontrollers

    Article • October 2006, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  131. Evaluating the Yield of Repairable SRAMs for ATE

    Article • IEEE Transactions on Instrumentation and Measurement, October 2006, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  132. HDLQ

    Article • ACM Journal on Emerging Technologies in Computing Systems, October 2006, ACM (Association for Computing Machinery)

    Prof. Marco Ottavi

  133. Reliability Evaluation of Repairable/Reconfigurable FPGAs

    Article • October 2006, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  134. Fault localization, error correction, and graceful degradation in radix 2 signed digit-based adders

    Article • IEEE Transactions on Computers, May 2006, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  135. QCA memory with parallel read∕serial write: design and analysis

    Article • IEE Proceedings - Circuits Devices and Systems, January 2006, the Institution of Engineering and Technology (the IET)

    Prof. Marco Ottavi

  136. Novel designs for thermally robust coplanar crossing in QCA

    Article • January 2006, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  137. Timing Verification of QCA Memory Architectures

    Article • January 2006, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  138. Clocking and Cell Placement for QCA

    Article • January 2006, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  139. A Line-Based Parallel Memory for QCA Implementation

    Article • IEEE Transactions on Nanotechnology, November 2005, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  140. Fault tolerant solid state mass memory for space applications

    Article • IEEE Transactions on Aerospace and Electronic Systems, October 2005, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  141. Tile-based QCA design using majority-like logic primitives

    Article • ACM Journal on Emerging Technologies in Computing Systems, October 2005, ACM (Association for Computing Machinery)

    Prof. Marco Ottavi

  142. A Comparative Evaluation of Designs for Reliable Memory Systems

    Article • Journal of Electronic Testing, August 2005, Springer Science + Business Media

    Prof. Marco Ottavi

  143. Estimating the Manufacturing Yield of Compiler-Based Embedded SRAMs

    Article • IEEE Transactions on Semiconductor Manufacturing, August 2005, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  144. Tile-based design of a serial memory in QCA

    Article • April 2005, ACM (Association for Computing Machinery)

    Prof. Marco Ottavi

  145. Simulation of reconfigurable memory core yield

    Article • April 2004, ACM (Association for Computing Machinery)

    Prof. Marco Ottavi

  146. Markov models of fault-tolerant memory systems under SEU

    Article • January 2004, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  147. Design of a fault tolerant solid state mass memory

    Article • IEEE Transactions on Reliability, December 2003, Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  148. Localization of Faults in Radix-n Signed Digit Adders

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  149. Design of a QCA Memory with Parallel Read/Serial Write

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  150. Evaluating the Data Integrity of Memory Systems by Configurable Markov Models

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  151. Novel memory designs for QCA implementation

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  152. On the Analysis of Reed Solomon Coding for Resilience to Transient/Permanent Faults in Highly Reliable Memories

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  153. A fault-tolerant solid state mass memory for highly reliable instrumentation

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  154. A signed digit adder with error correction and graceful degradation capabilities

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  155. On the yield of compiler-based eSRAMs

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  156. Yield evaluation methods of SRAM arrays: a comparative study

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  157. Bit flip injection in processor-based architectures: a case study

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  158. Development of a dynamic routing system for a fault tolerant solid state mass memory

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  159. Modeling QCA defects at molecular-level in combinational circuits

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  160. Data integrity evaluations of reed solomon codes for storage systems

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  161. Testing of inter-word coupling faults in word-oriented SRAMs

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  162. Error detection in signed digit arithmetic circuit with parity checker [adder example]

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  163. A fault tolerant hardware based file system manager for solid state mass memory

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  164. Yield analysis of compiler-based arrays of embedded SRAMs

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  165. A self-checking cell logic block for fault tolerant FPGAs

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  166. System-on-chip oriented fault-tolerant sequential systems implementation methodology

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi

  167. A fault-tolerant 176 Gbit solid state mass memory architecture

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    Prof. Marco Ottavi