All Stories

  1. Electrical Properties and Interface Structure of SiC MOSFETs with Barium Interface Passivation

    Article • Materials Science Forum, May 2017, Trans Tech Publications

    Professor James M LeBeau

  2. Accurate Nanoscale Crystallography in Real-Space Using Scanning Transmission Electron Microscopy

    Article • Microscopy and Microanalysis, July 2015, Cambridge University Press

    Professor James M LeBeau

  3. Atom Column Indexing: Atomic Resolution Image Analysis Through a Matrix Representation

    Article • Microscopy and Microanalysis, November 2014, Oxford University Press (OUP)

    Professor James M LeBeau