All Stories

  1. Gas phase and surface processes of SiC N O film formation by parallel plate plasma-enhanced chemical vapor deposition without heat assistance
  2. Multimolecular interactions for SiC N O film formation by parallel plate plasma-enhanced chemical vapor deposition without heat assistance
  3. Chlorine Trifluoride Gas Etching Design for Quickly and Uniformly Removing a Thick C-Face 4H-Silicon Carbide Layer
  4. Lowest Concentration of Chlorine Trifluoride Gas for Cleaning Silicon Carbide Chemical Vapor Deposition Reactor
  5. Water Flow Improvement by Pinhole Outlet in Batch-Type Wet Cleaning Bath for Large-Diameter Wafers
  6. Chemical Conditions of SiCNO Film Exposed to ClF3 Gas
  7. Boron-Silicon Film Chemical Vapor Deposition Using Boron Trichloride, Dichlorosilane and Monomethylsilane Gases
  8. Anticorrosive Behavior of Aluminum Nitride Surface Exposed to Chlorine Trifluoride Gas at High Temperatures
  9. Design of a Silicon Carbide Chemical Vapor Deposition Reactor Cleaning Process Using Chlorine Trifluoride Gas Accounting for Exothermic Reaction Heat
  10. Temperature Influence on Organic Molecular Interaction on Silicon Oxide Surface In Situ Measured Utilizing a Quartz Crystal Microbalance
  11. Deposition and etching behaviour of boron trichloride gas at silicon surface
  12. High Temperature SiC Reactor Cleaning Using Chlorine Trifluoride Gas Achieved by Purified Pyrolytic Carbon Coating Film
  13. Chlorine Trifluoride Gas Distributor Design for Single-Crystalline C-Face 4H-Silicon Carbide Wafer Etcher
  14. Exposure of Tantalum Carbide, Silicon Nitride and Aluminum Nitride to Chlorine Trifluoride Gas
  15. High-Temperature Reactor Cleaning Using Chlorine Trifluoride Gas for Silicon Carbide Chemical Vapor Deposition
  16. Influence of Metal and Polymer Substrate on SiCxNyOz Film Formation by Non-Heat Assistance Plasma-Enhanced Chemical Vapor Deposition Using Monomethylsilane, Nitrogen and Argon Gases
  17. Behavior of Viscous Liquid Byproduct Formed in Exhaust Tube by Silicon Carbide Epitaxial Growth
  18. Silicon epitaxial growth accelerated by parallel Langmuir processes using SiH2Cl2 and SiH3CH3 gases
  19. 4H-Silicon Carbide Wafer Surface after Chlorine Trifluoride Gas Etching
  20. Water Outlet Design of Wet Cleaning Bath for 300-mm Diameter Silicon Wafers
  21. Susceptor Coating Materials Applicable for SiC Reactor Cleaning
  22. Mirror Etching of Single Crystalline C-Face 4H-Silicon Carbide Wafer by Chlorine Trifluoride Gas
  23. Non-Heat Assistance Plasma-Enhanced Chemical Vapor Deposition of SiCxNyOzFilm Using Monomethylsilane, Nitrogen and Argon
  24. Quick Cleaning Process for Silicon Carbide Chemical Vapor Deposition Reactor
  25. In Situ Cleaning Process of Silicon Carbide Epitaxial Reactor for Removing Film-Type Deposition Formed on Susceptor
  26. Etching Rate Behavior of 4H-Silicon Carbide Epitaxial Film Using Chlorine Trifluoride Gas
  27. Non-heat assistance chemical vapor deposition of amorphous silicon carbide using monomethylsilane gas under argon plasma
  28. Cleaning Process for Using Chlorine Trifluoride Gas Silicon Carbide Chemical Vapor Deposition Reactor
  29. Chlorine Trifluoride Gas Transport and Etching Rate Distribution in Silicon Carbide Dry Etcher
  30. Surface and gas phase reactions induced in a trichlorosilane–SiH x system for silicon film deposition
  31. Low temperature amorphous silicon carbide thin film formation process on aluminum surface using monomethylsilane gas and trichlorosilane gas
  32. Precipitates formed in silicon wafers by prolonged high-temperature annealing in nitrogen atmosphere
  33. Development of Silicon Carbide Dry Etcher Using Chlorine Trifluoride Gas
  34. Off-Orientation Influence on C-Face (0001) 4H-SiC Surface Morphology Produced by Etching Using Chlorine Trifluoride Gas
  35. Cleaning Process Applicable to Silicon Carbide Chemical Vapor Deposition Reactor
  36. Langasite crystal microbalance frequency behavior over wide gas phase conditions for chemical vapor deposition
  37. Numerical Calculation Model of Single Wafer Wet Etcher Using Swinging Nozzle
  38. Precipitates caused by prolonged high-temperature annealing in floating zone silicon wafer grown from Czochralski single-crystal rod
  39. Crystalline Defects in Silicon Wafer Caused by Prolonged High-Temperature Annealing in Nitrogen Atmosphere
  40. Chemical vapor deposition of amorphous silicon carbide thin films on metal surfaces using monomethylsilane gas at low temperatures
  41. Amorphous Silicon Carbide Film Formation at Room Temperature by Monomethylsilane Gas
  42. Off-Orientation Influence on C-Face (0001) 4H-SiC Surface Morphology Produced by Etching Using Chlorine Trifluoride Gas
  43. Silicon Chemical Vapor Deposition Process Using a Half-Inch Silicon Wafer for Minimal Manufacturing System
  44. Surface Chemical Reaction Model of Silicon Dioxide Film Etching by Dilute Hydrogen Fluoride Using a Single Wafer Wet Etcher
  45. Numerical calculation model of a single wafer wet etcher using a swinging nozzle
  46. Density of Etch Pits on C-Face 4H-SiC Surface Produced by ClF3 Gas
  47. Density and Behavior of Etch Pits on C-Face 4H-SiC Surface Produced by CIF3 Gas
  48. Concentration of Three Organic Compounds Influencing each other on Silicon Surface
  49. Silicon Epitaxial Growth Rate and Transport Phenomena in a Vertical Stacked-Type Multi-Wafer Reactor
  50. Langasite Crystal Microbalance Used for In-Situ Monitoring of Amorphous Silicon Carbide Film Deposition
  51. Room Temperature Process for Chemical Vapor Deposition of Amorphous Silicon Carbide Thin Film Using Monomethylsilane Gas
  52. Room temperature process for chemical vapor deposition of amorphous silicon carbide thin film using monomethylsilane gas
  53. Langasite Crystal Microbalance for Development of Reactive Surface Preparation of Silicon Carbide Film Deposition from Monomethylsilane Gas
  54. Low Temperature SiC Film Deposition Using Trichlorosilane Gas and Monomethylsilane Gas
  55. Silicon epitaxial growth process using trichlorosilane gas in a single-wafer high-speed substrate rotation reactor
  56. Etch Pits on 4H-SiC Surface Produced by ClF3 Gas
  57. Silicon Surface Morphology after Annealing in Ambient Hydrogen Containing a Trace Amount of Hydrogen Halide Gas
  58. Advance of Atomic Layer Deposition in Semiconductor Materials Manufacturing Process: Cleaning Technology for Thin Film Formation Reactor
  59. Mechanism of Silicon Carbide Film Deposition at Room Temperature Using Monomethylsilane Gas
  60. Water Motion over a Wafer Surface Rotating in a Single-Wafer Wet Cleaner
  61. Water Motion over a Wafer Surface Rotating in a Single-Water Wet Cleaner
  62. 4H-SiC Surface Morphology Etched Using ClF3 Gas
  63. Dominant Forces for Driving Bubbles in a Wet Cleaning Bath Using Megasonic Wave
  64. Molecular Interaction Radii and Rate Constants for Clarifying Organic Compound Physisorption on Silicon Surface
  65. Silicon carbide film deposition at low temperatures using monomethylsilane gas
  66. Hafnium Oxide Film Etching Using Hydrogen Chloride Gas
  67. Etching Rate of Silicon Dioxide Using Chlorine Trifluoride Gas
  68. Atomospheric Pressure SiC Film Deposition at Low Temperatures Using SiH
  69. Hafnium Oxide Etching Using Hydrogen Chloride Gas
  70. Temperature-Dependent Behavior of 4H-Silicon Carbide Surface Morphology Etched Using Chlorine Trifluoride Gas
  71. Water and Bubble Motions Under Megasonic Wave in a Silicon Wafer Wet Cleaning Bath
  72. Heat Transport and Temperature Gradient in Silicon-on-Insulator Wafer during Flash Lamp Annealing Process
  73. Decarbonation and Pore Structural Change of Ca-Solid Reactant for CaO/CO2 Chemical Heat Pump
  74. Etching Rate Behavior of 4H-Silicon Carbide Using Chlorine Trifloride Gas
  75. Heat Transport Analysis for Flash Lamp Annealing
  76. Polycrystalline silicon carbide film deposition using monomethylsilane and hydrogen chloride gases
  77. Water Motion in a Water Curtain Head for Cleaning a Large Glass Plate
  78. Carbonation/Decarbonation of Ca-Solid Reactant Derived from Natural Limestone for Thermal-Energy Storage and Temperature Upgrade
  79. In-Situ Measurement Method and Rate Theory for Clarifying Multi-Component Organic Compounds Adsorption and Desorption on Silicon Surface
  80. Physisorption and Desorption of Diethyl Phthalate and Isopropanol on a Silicon Surface
  81. Small-Batch Reactor Development for Silicon Epitaxial Film Growth Based on Theory of Transport Phenomena
  82. Etch rate and surface morphology of polycrystalline β-silicon carbide using chlorine trifluoride gas
  83. Air Flow in Square Quartz Plate Spin Cleaner
  84. Dominant rate process of silicon surface etching by hydrogen chloride gas
  85. Highly Concentrated Ozone Gas for Preparing Wettable Polyimide Surface
  86. Silicon Carbide Etching Using Chlorine Trifluoride Gas
  87. Quartz Crystal Microbalance for Silicon Surface Organic Contamination
  88. Gas Velocity Influence on Silicon Surface Organic Contamination Evaluated Using Quartz Crystal Microbalance
  89. Heat Balance Evaluation for Rapid Thermal Processing System Design
  90. Formation mechanism of local thickness profile of silicon epitaxial film
  91. Silicon Etch Rate Using Chlorine Trifluoride
  92. Water Motion in Carrierless Wet Station
  93. Airborne Organic Contamination Behavior on Silicon Wafer Surface
  94. High-Performance Silicon Etching Using Chlorine Trifluoride Gas
  95. Hot-wall and cold-wall environments for silicon epitaxial film growth
  96. Adsorption and Desorption Rate of Multicomponent Organic Species on Silicon Wafer Surface
  97. Design of a Rapid Thermal Processing System Using a Reflection-Resolved Ray Tracing Method
  98. Development of Evaluation Method for Organic Contamination on Silicon Wafer Surfaces
  99. Model of boron incorporation into silicon epitaxial film in a B2H6–SiHCl3–H2 system
  100. Instability of diborane gas in silicon epitaxial film growth
  101. Rate Theory of Multicomponent Adsorption of Organic Species on Silicon Wafer Surface
  102. Thermal Conditions in Rapid Thermal Processing System Using Circular Infrared Lamp
  103. Chemical process of silicon epitaxial growth in a SiHCl3–H2 system
  104. Model on transport phenomena and epitaxial growth of silicon thin film in SiHCl3H2 system under atmospheric pressure