All Stories

  1. The outstanding properties of graphene-insulator-semiconductor (GIS) test structures for photoelectric determination of semiconductor devices band diagram

    Article • March 2017, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Henryk M. Przewlocki

  2. Photoelectric Phenomena and Photoelectric Characterization Methods of the MOS System - Basics and New Developments

    Article • Journal of Nano Research, February 2016, Trans Tech Publications

    Dr Henryk M. Przewlocki

  3. Internal photoemission technique for high-k oxide/semiconductor band offset determination: The influence of semiconductor bulk properties

    Article • September 2014, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Henryk M. Przewlocki

  4. Distributions of electric parameters in MOS structures on 3C-SiC substrate

    Article • Open Physics, January 2013, De Gruyter

    Dr Henryk M. Przewlocki

  5. Characterization of Band Diagrams of Different Metal-SiO2-SiC(3C) Structures

    Article • Materials Science Forum, January 2012, Trans Tech Publications

    Dr Henryk M. Przewlocki

  6. New applications of internal photoemission to determine basic MOS system parameters

    Article • January 2006, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Henryk M. Przewlocki

  7. Effects of stress annealing on the index of refraction of SiO 2 layers in MOS devices

    Article • April 2003, SPIE

    Dr Henryk M. Przewlocki

  8. Theory and applications of internal photoemission in the MOS system at low electric fields

    Article • Solid-State Electronics, August 2001, Elsevier

    Dr Henryk M. Przewlocki