All Stories

  1. Aging monitor reuse for small delay fault testing

    Article • April 2017, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  2. Special session on early life failures

    Article • April 2017, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  3. A Neural-Network-Based Fault Classifier

    Article • November 2016, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  4. Functional Diagnosis for Graceful Degradation of NoC Switches

    Article • November 2016, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  5. Test Strategies for Reconfigurable Scan Networks

    Article • November 2016, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  6. High-Throughput Transistor-Level Fault Simulation on GPUs

    Article • November 2016, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  7. ETS 2015 best paper

    Article • May 2016, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  8. Formal verification of secure reconfigurable scan network infrastructure

    Article • May 2016, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  9. Fault tolerance of approximate compute algorithms

    Article • April 2016, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  10. Dependable on-chip infrastructure for dependable MPSOCs

    Article • April 2016, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  11. Multi-Layer Test and Diagnosis for Dependable NoCs

    Article • September 2015, ACM (Association for Computing Machinery)

    Hans-Joachim Wunderlich

  12. Efficient observation point selection for aging monitoring

    Article • July 2015, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  13. High-Throughput Logic Timing Simulation on GPGPUs

    Article • ACM Transactions on Design Automation of Electronic Systems, June 2015, ACM (Association for Computing Machinery)

    Hans-Joachim Wunderlich

  14. Testing visions

    Article • May 2015, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  15. Adaptive multi-layer techniques for increased system dependability

    Article • it - Information Technology, January 2015, De Gruyter

    Hans-Joachim Wunderlich

  16. GPU-Accelerated Small Delay Fault Simulation

    Article • January 2015, EDAA

    Hans-Joachim Wunderlich

  17. High Quality System Level Test and Diagnosis

    Article • November 2014, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  18. Area-efficient synthesis of fault-secure NoC switches

    Article • July 2014, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  19. Test und Diagnose

    Article • May 2014, Carl Hanser Verlag

    Hans-Joachim Wunderlich

  20. Incremental computation of delay fault detection probability for variation-aware test generation

    Article • May 2014, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  21. Diagnosis of multiple faults with highly compacted test responses

    Article • May 2014, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  22. Structural Software-Based Self-Test of Network-on-Chip

    Article • April 2014, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  23. SAT-based ATPG beyond stuck-at fault testing

    Article • it - Information Technology, January 2014, De Gruyter

    Hans-Joachim Wunderlich

  24. Bit-Flipping Scan - A unified architecture for fault tolerance and offline test

    Article • January 2014, EDAA

    Hans-Joachim Wunderlich

  25. Bit-Flipping Scan - A unified architecture for fault tolerance and offline test

    Article • January 2014, EDAA

    Hans-Joachim Wunderlich

  26. Securing Access to Reconfigurable Scan Networks

    Article • November 2013, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  27. Accurate Multi-cycle ATPG in Presence of X-Values

    Article • November 2013, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  28. Efficacy and efficiency of algorithm-based fault-tolerance on GPUs

    Article • July 2013, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  29. Scan pattern retargeting and merging with reduced access time

    Article • May 2013, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  30. Efficient Variation-Aware Statistical Dynamic Timing Analysis for Delay Test Applications

    Article • January 2013, EDAA

    Hans-Joachim Wunderlich

  31. Modeling, verification and pattern generation for reconfigurable scan networks

    Article • November 2012, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  32. Scan Test Power Simulation on GPGPUs

    Article • November 2012, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  33. Acceleration of Monte-Carlo molecular simulations on hybrid computing architectures

    Article • September 2012, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  34. Efficient system-level aging prediction

    Article • May 2012, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  35. Built-in self-diagnosis exploiting strong diagnostic windows in mixed-mode test

    Article • May 2012, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  36. Exact stuck-at fault classification in presence of unknowns

    Article • May 2012, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  37. Embedded Test for Highly Accurate Defect Localization

    Article • November 2011, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  38. Diagnostic Test of Robust Circuits

    Article • November 2011, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  39. Efficient BDD-based Fault Simulation in Presence of Unknown Values

    Article • November 2011, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  40. P-PET: Partial pseudo-exhaustive test for high defect coverage

    Article • September 2011, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  41. Fail-safety in core-based system design

    Article • July 2011, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  42. Soft error correction in embedded storage elements

    Article • July 2011, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  43. Structural Test for Graceful Degradation of NoC Switches

    Article • May 2011, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  44. Structural In-Field Diagnosis for Random Logic Circuits

    Article • May 2011, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  45. Towards Variation-Aware Test Methods

    Article • May 2011, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  46. On Determining the Real Output Xs by SAT-Based Reasoning

    Article • December 2010, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  47. Variation-Aware Fault Modeling

    Article • December 2010, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  48. Algorithm-based fault tolerance for many-core architectures

    Article • May 2010, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  49. Low-power test planning for arbitrary at-speed delay-test clock schemes

    Article • April 2010, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  50. BISD: Scan-based Built-In self-diagnosis

    Article • March 2010, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  51. Algorithmen-basierte Fehlertoleranz für Many-Core-Architekturen

    Article • it - Information Technology, January 2010, De Gruyter

    Hans-Joachim Wunderlich

  52. Generalized Fault Modeling for Logic Diagnosis

    Article • October 2009, Springer Science + Business Media

    Hans-Joachim Wunderlich

  53. Models for Power-Aware Testing

    Article • October 2009, Springer Science + Business Media

    Hans-Joachim Wunderlich

  54. Software-Based Hardware Fault Tolerance for Many-Core Architectures

    Article • October 2009, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  55. Power-Aware Design-for-Test

    Article • August 2009, Springer Science + Business Media

    Hans-Joachim Wunderlich

  56. Restrict Encoding for Mixed-Mode BIST

    Article • May 2009, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  57. Test Encoding for Extreme Response Compaction

    Article • May 2009, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  58. Adaptive Debug and Diagnosis without Fault Dictionaries

    Article • May 2008, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  59. Selective Hardening in Early Design Steps

    Article • May 2008, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  60. Signature Rollback - A Technique for Testing Robust Circuits

    Article • April 2008, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich, Christian Hachmann

  61. Scan Chain Organization for Embedded Diagnosis

    Article • March 2008, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  62. Scan chain organization for embedded diagnosis

    Article • January 2008, ACM (Association for Computing Machinery)

    Hans-Joachim Wunderlich

  63. Adaptive Debug and Diagnosis without Fault Dictionaries

    Article • May 2007, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  64. Programmable deterministic Built-In Self-Test

    Article • January 2007, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  65. BIST Power Reduction Using Scan-Chain Disable in the Cell Processor

    Article • October 2006, Institute of Electrical & Electronics Engineers (IEEE)

    Hans-Joachim Wunderlich

  66. Test and Testable Design

    Article • January 2000, Springer Science + Business Media

    Hans-Joachim Wunderlich

  67. BIST for systems-on-a-chip

    Article • Integration, December 1998, Elsevier

    Hans-Joachim Wunderlich

  68. Mixed-Mode BIST Using Embedded Processors

    Article • January 1998, Springer Science + Business Media

    Hans-Joachim Wunderlich

  69. Prüfpfad-Techniken

    Article • January 1991, Springer Science + Business Media

    Hans-Joachim Wunderlich

  70. Einleitung

    Article • January 1991, Springer Science + Business Media

    Hans-Joachim Wunderlich

  71. Hochintegrierte Schaltungen: Prüfgerechter Entwurf und Test

    Article • January 1991, Springer Science + Business Media

    Hans-Joachim Wunderlich

  72. Schaltungs- und Fehlermodellierung

    Article • January 1991, Springer Science + Business Media

    Hans-Joachim Wunderlich

  73. Selbsttestbare Schaltungen

    Article • January 1991, Springer Science + Business Media

    Hans-Joachim Wunderlich

  74. Teststrategien für Schaltwerke

    Article • January 1991, Springer Science + Business Media

    Hans-Joachim Wunderlich

  75. Fehlersimulation

    Article • January 1991, Springer Science + Business Media

    Hans-Joachim Wunderlich

  76. Technologische Grundlagen

    Article • January 1991, Springer Science + Business Media

    Hans-Joachim Wunderlich

  77. Deterministische Testerzeugung für Schaltnetze

    Article • January 1991, Springer Science + Business Media

    Hans-Joachim Wunderlich

  78. Der pseudo-erschöpfende Test

    Article • January 1991, Springer Science + Business Media

    Hans-Joachim Wunderlich

  79. Der Test mit Zufallsmustern

    Article • January 1991, Springer Science + Business Media

    Hans-Joachim Wunderlich

  80. Testverfahren für spezielle Strukturen

    Article • January 1991, Springer Science + Business Media

    Hans-Joachim Wunderlich

  81. Emulation of Scan Paths in Sequential Circuit Synthesis

    Article • January 1991, Springer Science + Business Media

    Hans-Joachim Wunderlich

  82. Automatisierung des Entwurfs vollständig testbarer Schaltungen

    Article • January 1988, Springer Science + Business Media

    Hans-Joachim Wunderlich

  83. Praktische Ergebnisse

    Article • January 1987, Springer Science + Business Media

    Hans-Joachim Wunderlich

  84. Einleitung

    Article • January 1987, Springer Science + Business Media

    Hans-Joachim Wunderlich

  85. Grundlagen. Definitionen und Vorarbeiten

    Article • January 1987, Springer Science + Business Media

    Hans-Joachim Wunderlich

  86. Anwendungen bei Test- und Synthese-Algorithmen

    Article • January 1987, Springer Science + Business Media

    Hans-Joachim Wunderlich

  87. Das Testproblem für integrierte Schaltungen

    Article • January 1987, Springer Science + Business Media

    Hans-Joachim Wunderlich

  88. Die Bestimmung effizienter Zufallstests

    Article • January 1987, Springer Science + Business Media

    Hans-Joachim Wunderlich

  89. Fehlerentdeckungs- und Signalwahrscheinlichkeiten

    Article • January 1987, Springer Science + Business Media

    Hans-Joachim Wunderlich

  90. On fault modeling for dynamic MOS circuits

    Article • January 1986, ACM (Association for Computing Machinery)

    Hans-Joachim Wunderlich

  91. PROTEST

    Article • January 1985, ACM (Association for Computing Machinery)

    Hans-Joachim Wunderlich

  92. Bewertung und Verbesserung der Zuverlässigkeit von mikroelektronischen Komponenten in mechatronischen Systemen

    Article • Springer Science + Business Media

    Hans-Joachim Wunderlich