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  1. Tender X-ray diffraction anomalous fine structure spectroscopy applied to the study of PbSc 0.5 Nb 0.5 O 3 ...

    Article • Journal of Synchrotron Radiation, September 2025, International Union of Crystallography

    Gianluca Ciatto

  2. Local structure and ordering of Al atoms in AlxGa1−xN epilayers

    Article • Applied Physics Letters, December 2023, American Institute of Physics

    Gianluca Ciatto

  3. FORTE – a multipurpose high-vacuum diffractometer for tender X-ray diffraction and spectroscopy at the SIRIUS beamline of Synchrotron SOLEIL

    Article • Journal of Synchrotron Radiation, May 2019, International Union of Crystallography

    Gianluca Ciatto

  4. Quantitative determination of In clustering in In-rich InxGa1−xN thin films

    Article • Journal of Physics D Applied Physics, September 2014, Institute of Physics Publishing

    Gianluca Ciatto