All Stories

  1. Acceptance sampling plans based on EWMA yield index for the first order autoregressive process
  2. Selecting better process based on difference statistic using double sampling plan
  3. Acceptance sampling plan based on an exponentially weighted moving average statistic with the yield index for autocorrelation between polynomial profiles
  4. Comparison of different control charts for a Weibull process with type-I censoring
  5. Sampling Schemes by Variables Inspection for the First-Order Autoregressive Model between Linear Profiles
  6. Using BBPSO Algorithm to Estimate the Weibull Parameters with Censored Data
  7. A Process Yield for Simple Linear Profiles
  8. Defect Prediction for New Products During the Development Phase