All Stories

  1. Erratum: “Microellipsometry study of plasmonic properties of metal-insulator-metal structures with ordered lattices of nanoparticles” [J. Appl. Phys. 129, 123104 (2021)]

    Article • Journal of Applied Physics, January 2022, American Institute of Physics

    Eugene Bortchagovsky

  2. Microellipsometry study of plasmonic properties of metal–insulator–metal structures with ordered lattices of nanoparticles

    Article • Journal of Applied Physics, March 2021, American Institute of Physics

    Eugene Bortchagovsky

  3. Plasmonic Properties of Thin Annealed Gold Films

    Article • Plasmonics, July 2020, Springer Science + Business Media

    Eugene Bortchagovsky

  4. Methane as a novel doping precursor for deposition of highly conductive ZnO thin films by magnetron sputtering

    Article • Vacuum, April 2020, Elsevier

    Eugene Bortchagovsky

  5. Plasmonic coupling and how standard ellipsometry can feel surface plasmon

    Article • Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, January 2020, American Vacuum Society

    Eugene Bortchagovsky

  6. Luminescent analysis of the quality of CdS nanocrystals depending on technological parameters

    Article • Semiconductor Physics Quantum Electronics & Optoelectronics, June 2019, Co. Ltd. Ukrinformnauka

    Eugene Bortchagovsky

  7. Simple Modeling of the Ratio of Fields at a Tip and a Contacting Surface with External Illumination

    Article • Journal of Nanotechnology, August 2018, Hindawi Publishing Corporation

    Eugene Bortchagovsky

  8. Optical Absorption Imaging by Photothermal Expansion with 4 nm Resolution

    Article • ACS Photonics, May 2018, American Chemical Society (ACS)

    Eugene Bortchagovsky

  9. Internal Reflection of the Surface of a Plasmonic Substrate Covered by Active Nanoparticles

    Article • January 2018, Springer Science + Business Media

    Eugene Bortchagovsky

  10. Direct synthesized graphene-like film on SiO2: Mechanical and optical properties

    Article • Semiconductor Physics Quantum Electronics & Optoelectronics, December 2016, Co. Ltd. Ukrinformnauka

    Eugene Bortchagovsky

  11. Simple modeling of the ratio of fields at a tip and at contacting surface

    Article • Nanospectroscopy, January 2016, De Gruyter

    Eugene Bortchagovsky

  12. Deficiency of Standard Effective-Medium Approximation for Ellipsometry of Layers of Nanoparticles

    Article • Journal of Nanomaterials, January 2015, Hindawi Publishing Corporation

    Eugene Bortchagovsky

  13. Ellipsometry of monolayers of metallic nanoparticles taking into account depolarization

    Article • Thin Solid Films, November 2014, Elsevier

    Eugene Bortchagovsky

  14. Internal standard for tip-enhanced Raman spectroscopy

    Article • Applied Physics Letters, July 2013, American Institute of Physics

    Renato Zenobi, Dr Thomas Schmid, Eugene Bortchagovsky

  15. The concept of a near-field Raman probe

    Article • Nanoscale, January 2012, Royal Society of Chemistry

    Eugene Bortchagovsky

  16. Model for the effective medium approximation of nanostructured layers with the account of interparticle interactions

    Article • May 2011, SPIE

    Eugene Bortchagovsky

  17. Simulation of the response of the optical sensor based on the local plasmons in the layer of nanoparticles

    Article • May 2011, SPIE

    Eugene Bortchagovsky

  18. A tetrahedral tip as a probe for tip-enhanced Raman scattering and as a near-field Raman probe

    Article • Journal of Raman Spectroscopy, October 2009, Wiley

    Eugene Bortchagovsky

  19. Surface plasmon mediated tip enhanced Raman scattering

    Article • Applied Physics Letters, February 2009, American Institute of Physics

    Eugene Bortchagovsky

  20. Superlensing approach to a long-focus near-field probe

    Article • Optics Letters, July 2008, Optical Society of America (OSA)

    Eugene Bortchagovsky

  21. Some artefacts of the approaches with the discretization in near-field optics calculations

    Article • Journal of Microscopy, March 2008, Wiley

    Eugene Bortchagovsky

  22. On the optimum form of an aperture for a confinement of the optically excited electric near field

    Article • Journal of Microscopy, February 2008, Wiley

    Eugene Bortchagovsky

  23. An improved method for angular-resolved characterization of the optical anisotropy of pyrolytic carbon

    Article • Journal of Microscopy, December 2006, Wiley

    Eugene Bortchagovsky

  24. Transmission of an obliquely incident beam of light through small apertures in a metal film

    Article • Applied Physics B Photophysics and Laser Chemistry, June 2006, Springer Science + Business Media

    Eugene Bortchagovsky

  25. Optical properties of double-layer structure phthalocyanine–tetracyanoquinodimethane

    Article • Thin Solid Films, July 2004, Elsevier

    Eugene Bortchagovsky

  26. Ellipsometric monitoring of molecular evolution in freely suspended films of M12/10 ferroelectric liquid crystal

    Article • Thin Solid Films, May 2004, Elsevier

    Eugene Bortchagovsky

  27. Reflection polarized light microscopy and its application to pyrolytic carbon deposits

    Article • Journal of Applied Physics, May 2004, American Institute of Physics

    Eugene Bortchagovsky

  28. The shape of transmission spectra of thin films deposited on a substrate

    Article • The Journal of Chemical Physics, March 2004, American Institute of Physics

    Eugene Bortchagovsky

  29. Method for determination of the dielectric function of a thin absorbing film on variable substrates from transmission spectra

    Article • Applied Optics, December 2003, Optical Society of America (OSA)

    Eugene Bortchagovsky

  30. Transmission spectra of systems with thin films: classical analog of the Fano effect

    Article • April 2003, SPIE

    Eugene Bortchagovsky

  31. Optical properties of pyrolytic carbon deposits deduced from measurements of the extinction angle by polarized light microscopy

    Article • Carbon, January 2003, Elsevier

    Eugene Bortchagovsky

  32. On the modulation of optical transmission spectra of thin dye layers by a supporting medium

    Article • The Journal of Chemical Physics, September 2002, American Institute of Physics

    Eugene Bortchagovsky

  33. Influence of lateral interactions on Raman scattering by molecules adsorbed on a solid surface: a model study

    Article • Surface Science, July 2002, Elsevier

    Eugene Bortchagovsky

  34. Increased transmission of a thin gold film by adsorbed layers of dye molecules

    Article • Applied Physics Letters, May 2002, American Institute of Physics

    Eugene Bortchagovsky

  35. Ellipsometric approach to the monitoring of tip-surface proximity in NFO

    Article • Surface and Interface Analysis, January 2002, Wiley

    Eugene Bortchagovsky

  36. Comparison of ellipsometric methods for separate determination of thickness and optical constants of thin films

    Article • August 2001, SPIE

    Eugene Bortchagovsky

  37. Fullerene-embedded Langmuir-Blodgett films probed by spectroscopic ellipsometry

    Article • April 1998, SPIE

    Eugene Bortchagovsky

  38. Random error behavior for rotating-analyzer ellipsometers

    Article • April 1998, SPIE

    Eugene Bortchagovsky

  39. Spectroscopic ellipsometry of fullerene embedded Langmuir–Blodgett films with surface plasmon excitation

    Article • Thin Solid Films, February 1998, Elsevier

    Eugene Bortchagovsky

  40. Ellipsometric method for investigation of the optical anisotropy of thin films: theory and calculations

    Article • Thin Solid Films, October 1997, Elsevier

    Eugene Bortchagovsky

  41. Comparison of the precision of a null-ellipsometer to an ellipsometer with a rotating analyzer

    Article • April 1997, SPIE

    Eugene Bortchagovsky

  42. Possibilities of ellipsometry with surface plasmon excitation in the investigation of thin films in comparison to separated ellipsometry and surface plasmon spectroscopy

    Article • April 1997, SPIE

    Eugene Bortchagovsky

  43. Optical properties of fullerence C60 film in the vicinity of orientational phase transition probed by ellipsomerty

    Article • Journal of Molecular Structure, April 1995, Elsevier

    Eugene Bortchagovsky

  44. Some aspects of thin-film ellipsometry

    Article • October 1994, SPIE

    Eugene Bortchagovsky

  45. Invisible layers in ellipsometry

    Article • Thin Solid Films, October 1993, Elsevier

    Eugene Bortchagovsky

  46. Precursor film of a spreading drop of liquid crystal

    Article • January 1993, American Physical Society (APS)

    Eugene Bortchagovsky

  47. The method of molecular luminescent markers on solids in the study of superconducting and structural phase transitions

    Article • Physica C Superconductivity, February 1990, Elsevier

    Eugene Bortchagovsky