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  1. Design and Application of a Mobile Miniature Current Probe for Analyzing the Cause of EMI Noise in IC Circuits

    Article • IET Science Measurement & Technology, March 2017, the Institution of Engineering and Technology (the IET)

    HAN-NIEN LIN, Chung-Wei Kuo, Hung Chi Chen

  2. Electromagnetic interference noise suppression of writing/reading flash memory with multiple-execution control program

    Article • IET Science Measurement & Technology, November 2015, the Institution of Engineering and Technology (the IET)

    Chung-Wei Kuo