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  1. Adjacency Criticality: A Simple yet Effective Metric for Statistical Timing Yield Optimization of Digital Integrated Circuits

    Article • IET Circuits Devices & Systems, May 2019, the Institution of Engineering and Technology (the IET)

    Behnam Ghavami, Dr Mohsen Behnam

  2. Statistical soft error rate estimation of combinational circuits using Bayesian networks

    Article • COMPEL The International Journal for Computation and Mathematics in Electrical and Electronic Engineering, September 2016, Emerald

    Behnam Ghavami