All Stories

  1. Unravel of latent tracks in SOI- and SOS-structures with a high-k interlayer after impacts of swift heavy Xe and Bi ions
  2. Magnetic field induced exciton spin dynamics in indirect band gap (In,Al)As/AlAs quantum dots
  3. Change in the InSb nanocrystal growth direction at the Si/SiO2 interface during ion-beam synthesis
  4. Influence of substrate nitridation conditions and buffer layer structures on the crack-free GaN layers on silicon substrate grown by ammonia-assisted molecular beam epitaxy
  5. Ion-Beam Synthesis of Structure-Oriented Iron Nanoparticles in Single-Crystalline Rutile TiO2
  6. Dislocation Filter Based on LT-GaAs Layers for Monolithic GaAs/Si Integration
  7. The Nature of Ferromagnetism in a System of Self-Ordered α-FeSi2 Nanorods on a Si(111)-4° Vicinal Surface: Experiment and Theory
  8. Spin dynamics of charged excitons in ultrathin (In,Al)(Sb,As)/AlAs and Al(Sb,As)/AlAs quantum wells with an indirect band gap
  9. Al2O3/InGaAs interface passivation by fluorine-containing anodic layers
  10. Si-based light emitters synthesized with Ge+ ion bombardment
  11. Blister suppression in the CO+ molecule implanted SOI substrates with ultrathin buried oxides
  12. Transformation of the InP(001) surface upon annealing in an arsenic flux
  13. Effect of the structure and the phase composition on the mechanical properties of Al–Cu–Li alloy laser welds
  14. Resistive switching on individual V2O5nanoparticles encapsulated in fluorinated graphene films
  15. Selective MOCVD synthesis of VO2 crystals on nanosharp Si structures
  16. Recombination and spin dynamics of excitons in thin (Ga,Al)(Sb,As)/AlAs quantum wells with an indirect band gap and type-I band alignment
  17. Effect of Sn for the dislocation-free SiSn nanostructure formation on the vapor-liquid-crystal mechanism
  18. Resistive Switching Effect with ON/OFF Current Relation up to 10 9 in 2D Printed Composite Films of Fluorinated Graphene with V 2 O 5 Nanoparticles
  19. An Influence of the Si(111)3-4o Vicinal Surface on the Solid Phase Epitaxy of α-FeSi2 Nanorods and their Crystal Parameters
  20. Silicide phase formation by Mg deposition on amorphous Si. Ab initio calculations, growth process and thermal stability
  21. Thermoelectric Properties of Nanostructured Material Based on Si and GaSb
  22. On the structure and photoluminescence of dislocations in silicon
  23. Heterostructures with diffused interfaces: Luminescent technique for ascertainment of band alignment type
  24. A room-temperature-operated Si LED with β-FeSi2 nanocrystals in the active layer: μW emission power at 1.5 μm
  25. Self-assembled strained GeSiSn nanoscale structures grown by MBE on Si(100)
  26. Unexpected travel of Lomer-type dislocations in Ge/Ge x Si 1-x /Si(001) heterostructures
  27. Experimental observation of the dislocation walls in heterostructures with two interfaces: Ge/Ge0.5Si0.510 nm/Si(001) as an example
  28. Apoptosis-mediated endothelial toxicity but not direct calcification or functional changes in anti-calcification proteins defines pathogenic effects of calcium phosphate bions
  29. Quantum dots formed in InSb/AlAs and AlSb/AlAs heterostructures
  30. Influence of the additional p+ doped layers on the properties of AlGaAs/InGaAs/AlGaAs heterostructures for high power SHF transistors
  31. Surface-enhanced Raman spectroscopy of semiconductor nanostructures
  32. InAsSb on GaAs (001): influence of the arsenic molecules form on composition and crystalline properties of MBE layers
  33. InAs-based metal-oxide-semiconductor structure formation in low-energy Townsend discharge
  34. Enhancement of the Si p-n diode NIR photoresponse by embedding β-FeSi2 nanocrystallites
  35. Ferromagnetic HfO2/Si/GaAs interface for spin-polarimetry applications
  36. Hemozoin “knobs” in Opisthorchis felineus infected liver
  37. Peculiarities of structure, morphology, and electrochemistry of the doped 5-V spinel cathode materials LiNi0.5-x Mn1.5-y M x+y O4 (M = Co, Cr, Ti; x+y = 0.05) prepared by mechanochemical way
  38. Linear chains of Ge/Si quantum dots grown on a prepatterned surface formed by ion irradiation
  39. The convenient preparation of stable aryl-coated zerovalent iron nanoparticles
  40. Electroluminescent 1.5-μm light-emitting diodes based on p +-Si/NC β-FeSi2/n-Si structures
  41. Role of edge dislocations in plastic relaxation of GeSi/Si(001) heterostructures: Dependence of introduction mechanisms on film thickness
  42. Raman, AFM, and TEM profiling of QD multilayer structures
  43. High-quality single-crystal diamond-graphite-diamond membranes and devices
  44. Formation of Mg silicides on amorphous Si. Origin and role of high pressure in the film growth
  45. Oxide-free InAs(111)A interface in metal-oxide-semiconductor structure with very low density of states prepared by anodic oxidation
  46. Synthesis and Characterization of CuxS (x = 1–2) Nanocrystals Formed by the Langmuir–Blodgett Technique
  47. Structure and Optical Properties of Ca Silicide Films and Si/Ca3Si4/Si(111) Heterostructures
  48. Coexistence of type-I and type-II band alignment in Ga(Sb, P)/GaP heterostructures with pseudomorphic self-assembled quantum dots
  49. Specific features of plastic relaxation of a metastable Ge x Si1 − x layer buried between a silicon substrate and a relaxed germanium layer
  50. Brief observe on iron silicide growth on amorphous silicon
  51. Electroluminescence properties of p-Si/β-FeSi2NCs/…/n-Si mesa diodes with embedded multilayers ofβ-FeSi2nanocrystallites
  52. LiVPO4F/Li3V2(PO4)3 nanostructured composite cathode materials prepared via mechanochemical way
  53. The Mechanism of {113} Defect Formation in Silicon: Clustering of Interstitial–Vacancy Pairs Studied by In Situ High-Resolution Electron Microscope Irradiation
  54. Dislocation interaction of layers in the Ge/Ge-seed/GexSi1−x/Si(001) (x∼0.3–0.5) system: Trapping of misfit dislocations on the Ge-seed/GeSi interface
  55. CdZnS quantum dots formed by the Langmuir–Blodgett technique
  56. High-precision nanoscale length measurement
  57. Magnetic field-induced dissipation-free state in superconducting nanostructures
  58. Dual threshold diode based on the superconductor-to-insulator transition in ultrathin TiN films
  59. Mechanism of induced nucleation of misfit dislocations in the Ge-on-Si(001) system and its role in the formation of the core structure of edge misfit dislocations
  60. Non-linear conduction in the critical region of the superconductor-insulator transition in TiN thin films
  61. New system of self-assembled GaSb/GaP quantum dots
  62. Formation of iron and iron silicides on silicon and iron surfaces. Role of the deposition rate and volumetric effects
  63. Crystallization of Amorphous Si Nanoclusters in SiOx Films Using Femtosecond Laser Pulse Annealings
  64. Atomic structure and energy spectrum of Ga(As,P)/GaP heterostructures
  65. Evolution of silicon nanoclusters and hydrogen in SiNx:H films: Influence of high hydrostatic pressure under annealing
  66. Novel self-assembled quantum dots in the GaSb/AlAs heterosystem
  67. Preparation of thin films of platinum group metals by pulsed MOCVD. I. Deposition of Ir layers
  68. Preparation of thin films of platinum group metals by pulsed MOCVD. II. Deposition of Ru layers
  69. Influence of shape of GaN/AlN quantum dots on luminescence decay law
  70. Structural state of Ge/Si heterosystems with (001), (111), and (7 7 10) interfaces
  71. Decomposition of a supersaturated solid solution of Fe in GaAs
  72. Ge and GexSi1−x islands formation on GexSi1−x solid solution surface
  73. Edge misfit dislocations in the GeSi/Si(001) pair: Conditions and specific features of high-quantity generation
  74. Initial stage growth of GexSi1−x layers and Ge quantum dot formation on GexSi1−x surface by MBE
  75. High-quality structures with InAs/Al0.9Ga0.1As QDs produced by droplet epitaxy
  76. Exciton recombination dynamics in an ensemble of (In,Al)As/AlAs quantum dots with indirect band-gap and type-I band alignment
  77. Growth, structure and luminescence properties of multilayer Si/β-FeSi2NCs/Si/…/Si nanoheterostructures
  78. Spontaneous composition modulation during Cd x Hg1−x Te(301) molecular beam epitaxy
  79. Strained germanium films in Ge/InGaAs/GaAs heterostructures: Formation of edge misfit dislocations at the Ge/InGaAs interface
  80. Edge misfit dislocations in Ge x Si1 − x /Si(001) (x ∼ 1) heterostructures: role of buffer Ge y Si1 − y (y < x) interlayer in their formation
  81. On triple dislocation nodes observed by TEM in a Ge0.4Si0.6film grown on a slightly deviating (0 0 1)Si substrate
  82. Defects in the crystal structure of Cd x Hg1 − x Te layers grown on the Si (310) substrates
  83. Mechanisms of edge-dislocation formation in strained films of zinc blende and diamond cubic semiconductors epitaxially grown on (001)-oriented substrates
  84. Role of cross-slipping in formation of edge dislocations in heteroepitaxial systems GeSi-on-Si(001) and Ge-on-InGaAs/GaAs
  85. Optical property improvement of InAs/GaAs quantum dots grown by hydrogen-plasma-assisted molecular beam epitaxy
  86. Inclined misfit dislocations in a film/substrate system
  87. Nonradiative energy transfer between vertically coupled indirect and direct bandgap InAs quantum dots
  88. Specific features of formation and propagation of 60° and 90° misfit dislocations in GexSi1−x/Si films with x>0.4
  89. Initial stages of Ge epitaxy on Si(111) under quasi-equilibrium growth conditions
  90. High quality relaxed GaAs quantum dots in GaP matrix
  91. Formation of edge misfit dislocations in GexSi1−x(x∼0.4–0.8) films grown on misoriented (001)→(111) Si substrates: Features before and after film annealing
  92. Precise surface measurements at the nanoscale
  93. Heteroepitaxy of Ge x Si1 − x (x ∼ 0.4–0.5) films on Si(001) substrates misoriented to (111): Formation of short edge misfit dislocations alone in the misorientation direction
  94. 10.1007/s11700-008-1018-9
  95. 10.1007/s11453-008-1001-5
  96. Crystal perfection of GaP films grown on Si substrates by solid-source MBE with atomic hydrogen
  97. Pulsed ion-beam assisted deposition of Ge nanocrystals on SiO2 for non-volatile memory device
  98. The influence of elastic strains on the growth and properties of vertically ordered Ge “hut”-clusters
  99. Formation of misfit edge dislocations in Ge x Si1 − x films (x ∼ 0.4–0.5) grown on tilted Si(001) → (111) substrates
  100. Effect of the ion-energy loss rate on defect formation during implantation in silicon nanocrystals
  101. Atomic and energy structure of InAs/AlAs quantum dots
  102. Formation of edge misfit dislocations in GexSi1−x (x∼0.4–0.5) films grown on misoriented (001)→(111) Si substrates
  103. Features of formation and propagation of 60° and 90° misfit dislocations in GexSi1−x∕Si (x∼0.4–0.5) films caused by Si substrate misorientation from (001)
  104. Investigation of Multilayer Silicon Structures with Buried Iron Silicide Nanocrystallites: Growth, Structure, and Properties
  105. Potentialities and basic principles of controlling the plastic relaxation of GeSi/Si and Ge/Si films with stepwise variation in the composition
  106. Application of high-resolution electron microscopy for visualization and quantitative analysis of strain fields in heterostructures
  107. New Compositionally-Ordered GeSi Nano Dots Fabricated with 1250 keV Electrons
  108. Plastic relaxation of GeSi/Si(001) films grown by molecular-beam epitaxy in the presence of the Sb surfactant
  109. Formation, crystal structure, and properties of silicon with buried iron disilicide nanocrystallites on Si (100) substrates
  110. Morphological transformations of vanadium oxide films during low-temperature reduction in hydrogen electron cyclotron resonance plasma
  111. Silicon layers atop iron silicide nanoislands on Si(100) substrate: Island formation, silicon growth, morphology and structure
  112. Role of the dislocation screw component in the formation of the dislocation structure in Ge- and Si-based semiconductor heterosystems
  113. VARIATION OF IN-PLANE LATTICE CONSTANT OF Si/Ge/Si HETEROSTRUCTURES WITH Ge QUANTUM DOTS
  114. Pulsed ion-beam induced nucleation and growth of Ge nanocrystals on SiO2
  115. Structure and electrical properties of polycrystalline SiGe films grown by molecular beam deposition
  116. Narrowing of ground energy level distribution in an array of InAs/AlAs QDs by post grown annealing
  117. Sb as surfactant at plastic relaxation of GeSi/Si(001) films grown by molecular-beam epitaxy: Reduction of surface roughness value
  118. Dominating nucleation of misfit dislocations from the surface in GeSi/Si(001) films with a stepwise composition grown by means of molecular-beam epitaxy
  119. <title>Dense arrays of Ge nanoclusters induced by low-energy ion-beam assisted deposition on Si0<formula><inf><roman>2</roman></inf></formula> films</title>
  120. <title>Ge nanoclusters in GeO<formula><inf><roman>2</roman></inf></formula>: formation and optical properties</title>
  121. Strong sensitivity of photoluminescence of InAs/AlAs quantum dots to defects: evidence for lateral inter-dot transport
  122. Origination of misfit dislocations at the surface during the growth of GeSi/Si(001) films by low-temperature (300–400°C) molecular-beam epitaxy
  123. Interface phonons in semiconductor nanostructures with quantum dots
  124. Observation of antiphase domains in CdxHg1−x Te films on silicon by the phase contrast method in atomic force microscopy
  125. Ge/Si quantum dot nanostructures grown with low-energy ion beam-assisted epitaxy
  126. Heterostructures GexSi1−x/Si(001) grown by low-temperature (300–400°C) molecular beam epitaxy: Misfit dislocation propagation
  127. The formation of silicon nanocrystals in SiO2 layers by the implantation of Si ions with intermediate heat treatments
  128. Instability of the distribution of atomic steps on Si(111) upon submonolayer gold adsorption at high temperatures
  129. Effect of Quantum Confinement on Optical Properties of Ge Nanocrystals in GeO[sub 2] Films
  130. Formation of Ultrasmall Germanium Nanoislands with a High Density on an Atomically Clean Surface of Silicon Oxide
  131. Photoluminescence kinetics of wurtzite GaN quantum dots in an AlN matrix
  132. Direct observations of dislocation half-loops inserted from the surface of the GeSi heteroepitaxial film
  133. Strain relaxation of GeSi/Si(001) heterostructures grown by low-temperature molecular-beam epitaxy
  134. Heterostructures GexSi1−x/Si(001) (x=0.18–0.62) grown by molecular beam epitaxy at a low (350 °C) temperature: specific features of plastic relaxation
  135. Enhanced strain relaxation in a two-step process of GexSi1−x/Si(001) heterostructures grown by low-temperature molecular-beam epitaxy
  136. Surface morphology transitions induced by ion beam action during Ge/Si MBE
  137. MODIFICATION OF GROWTH MODE OF Ge ON Si BY PULSED LOW-ENERGY ION-BEAM IRRADIATION
  138. Formation of nanocrystalline silicon films using high-dose H+ ion implantation into silicon-on-insulator layers with subsequent rapid thermal annealing
  139. Growth and structure of Ge nanoislands on an atomically clean silicon oxide surface
  140. Optimization of the plastic relaxation of misfit stresses in GexSi1−x /Si(001) (x≤0.61) heterostructures
  141. Defects in silicon heat-treated under uniform stress and irradiated with fast neutrons
  142. Epitaxial silicon films deposited at high rates by gas-jet electron beam plasma CVD
  143. TEM study of incommensurate phases in minerals: implication for materials science
  144. InP decomposition phosphorus beam source for MBE: design, properties and superlattice growth
  145. Optical vibration modes in (Cd, Pb, Zn)S quantum dots in the Langmuir-Blodgett matrix
  146. Formation of Si nanocrystals in a-Si films using excimer laser
  147. X-ray-emission study of the structure of Si:H layers formed by low-energy hydrogen-ion implantation
  148. Plastic relaxation of solid GeSi solutions grown by molecular-beam epitaxy on the low temperature Si(100) buffer layer
  149. Influence of the misfit-dislocation screw component on the formation of threading dislocations in semiconductor heterostructures
  150. Effect of stress on defect transformation in hydrogen-implanted silicon and SOI structures
  151. Solid solutions GeSi grown by MBE on a low temperature Si (001) buffer layer: specific features of plastic relaxation
  152. In Situ HREM Irradiation Study of an Intrinsic Point Defects Clustering in FZ-Si
  153. Properties of extremely thin silicon layer in silicon-on-insulator structure formed by smart-cut technology
  154. GeSi films with reduced dislocation density grown by molecular-beam epitaxy on compliant substrates based on porous silicon
  155. Splitting and electrical properties of the SOI structure formed from the heavily boron doped silicon with using of the smart-cut technology