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  1. Strain evolution of SiGe-on-insulator obtained by the Ge-condensation technique
  2. In-situ transmission electron microscopy studies of the crystallization of N-doped Ge-rich GeSbTe materials
  3. Determination of the Free Gibbs Energy of Plate-Like Precipitates of Hydrogen Molecules and Silicon Vacancies Formed after H+ Ion Implantation into Silicon and Annealing