All Stories

  1. The statistical uncertainty of the Heydemann correction: a practical limit of optical quadrature homodyne interferometry
  2. Challenges in nanometrology: high precision measurement of position and size
  3. Ellipse fitting by nonlinear constraints to demodulate quadrature homodyne interferometer signals and to determine the statistical uncertainty of the interferometric phase
  4. Ultra-präzise Lageregelung mittels interferometrischer Positionsdetektion und Tauchspulenantrieb
  5. Improved measurement performance of the Physikalisch-Technische Bundesanstalt nanometer comparator by integration of a new Zerodur sample carriage
  6. The Road towards Accurate Optical Width Measurements at the Industrial Level
  7. The road towards accurate optical width measurements at the industrial level
  8. Implementing registration measurements on photomasks at the Nanometer Comparator
  9. Estimating the standard uncertainty contribution of the straight-line fit algorithm used to determine the position and the width of a graduation line
  10. Investigation of the cantilever response of non-contact atomic force microscopy for topography measurements in all three dimensions
  11. Dimensionelle Metrologie an ebenen Substraten mit Mikro- und NanostrukturenDimensional Metrology on Plane Substrates with Micro- and Nanostructures
  12. Influence of slant of objective on image formation in optical microscopes
  13. Achievement of sub nanometer reproducibility in line scale measurements with the nanometer comparator
  14. Characterizing the performance of the PTB line scale interferometer by measuring photoelectric incremental encoders
  15. Recent activities at PTB nanometer comparator
  16. Line scale comparison Nano3
  17. Final report on CCL-S3 supplementary line scale comparison Nano3
  18. Status of the nanometer comparator at PTB
  19. Accurate dimensional metrology with atomic force microscopy
  20. Step-height metrology for data storage applications
  21. Dimensional metrology with the NIST calibrated atomic force microscope
  22. Measurement of pitch and width samples with the NIST calibrated atomic force microscope
  23. Nanostrukturen als Testobjekte für die Rastertunnelmikroskopie