What is it about?
The results of theoretical and experimental study are presented for the question of how the X-ray multiple diffraction in a silicon single crystal influences the interference fringes of section topography for the 400 reflection in the Laue case. Two different cases of multiple diffraction are discovered for zero and very small values of the azimuthal angle for the sample in the form of a plate with the surface normal to the 001 direction.
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Why is it important?
We got new knowledge about interaction of x-ray with matter and found properties of new method to study such interaction
Perspectives
New theoretical method allows one to solve new tasks of x-ray optics
Professor Victor Germanovich Kohn
NRC "Kurchatov Institute"
Read the Original
This page is a summary of: A study of X-ray multiple diffraction by means of section topography, Acta Crystallographica Section A Foundations and Advances, July 2015, International Union of Crystallography,
DOI: 10.1107/s2053273315012176.
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