Unusual quasi-fivefold symmetric electron diffraction patterns are observed for silicon thin films.

What is it about?

A quantitative method performed on the diffraction patterns is developed to evaluate the number of twin operations.

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Why is it important?

The causes of twinning are presented and discussed by comparing the observations with the literature; dynamical considerations where the system tends to align {111} planes with the growth direction would explain multiple twinning and, in turn, the fivefold symmetry.